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We are developing advanced-packaging techniques to combine photonics and electronics in support of continued scaling in digital systems. Our research focuses on
The smallest unit of light is a "photon". Generation, manipulation and measurement of light at or near the fundamental limit of a photon can enhance the
While there is a clear need for communication networks supporting reliable information transfer between the various entities in the electric grid, there are
NIST is charged by the 2007 Energy Independence and Security Act (EISA) with facilitation of interoperability standards to enable successful implementation of
Mechanical strain impacts the performance of semiconductor devices. Manufacturing processes must be carefully controlled for strain to achieve high-yield and
Our objective is to develop metrology techniques for characterizing mechanical strain in semiconductor devices as well as reference materials for assessing the
Relentless, unabated growth of wireless communications technology, and the resulting extraordinary demand for bandwidth has led to the exploration of previously
Imaging in the terahertz frequency range enables the detection of concealed weapons and other contraband (e.g., explosives under clothing) without the use of
The thermal properties of materials and interfaces that govern the performance, reliability, and thermal management in microelectronics packages and wide
The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and innovation of
We use physics theories to understand and simulate the interaction of electrons, light, and mechanical probes with nanometer-scale structures, devices and
Time-resolved-emission microscopy (TREM) is a workhorse of semiconductor circuit evaluation. However, as transistor dimensions and power-supply voltages have
Machine learning and artificial intelligence (AI) have advanced so rapidly that they can now outperform humans at many (or even most) tasks. However, the large
Develop critical thermal and electrical transport measurement methods, instrumentation, and reference materials needed to support the development, performance
The focus of this NASCTN project is to develop test methods and perform measurements necessary to characterize the waveforms of radars that operate in the 3.5
The Waveform Metrology Project provides measurement and algorithmic support for waveform traceability to the optics and high-frequency electronics industries
Imagine how much safer a fire fighter's job would be if it were possible for a robot to navigate in a burning building and locate those in need of assistance