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Projects/Programs

Displaying 126 - 133 of 133

Training and optimization of hardware neural networks

Ongoing
The goal of this project is to develop a general method that can train many different types of neural networks, and to demonstrate and evaluate their performance on new emerging hardware. We aim to develop and demonstrate training on diverse hardware platforms, and in the presence of realistic noise

Transport Property Measurements for Semiconductors and Energy Materials

Ongoing
The properties of materials and interfaces that govern reliability, performance, and thermal transport in advanced microelectronic packages are not fully characterized or understood, especially at device length scales wherein properties may differ significantly from bulk or literature values

Ultrafast Spectroscopy to Advance Microelectronics

Ongoing
Continued advancement in microelectronics, including analog and digital electronics, power electronics, optics and photonics, and micromechanics for memory, processing, sensing, and communications as defined by the OSTP “National Strategy on Microelectronics Research,” requires knowledge of material

Universal Microscopy Standards

Ongoing
Microscopy standards that are available today have inadequate performance characteristics. As device linewidths decrease toward physical limits, the international roadmap of devices and systems (IRDS) has set uncertainty targets by the year 2025. This target is hard to hit, challenging the industry

Waveform Measurements of Radars Operating in the 3.5 GHz Band

Ongoing
This NASCTN effort is coordinated with the Department of Defense (DOD), and the results of this project will support the spectrum regulators as they develop a certification process for Spectrum Access Systems (SAS) and the associated Environmental Sensing Capability (ESC) that may be deployed in

Waveform Metrology Project

Ongoing
Optical measurement techniques: NIST uses the electro-optic sampling (EOS) technique to measure the vector response of photodiodes and provide phase traceability for commercial instrumentation, such as large-signal network analyzers, lightwave component analyzers, vector signal analyzers

Wireless Systems Metrology

Ongoing
The Wireless Systems Metrology Program supports the growing wireless industry by developing methods to test the operation and functionality of wireless devices in the presence of various types of distortion. This includes multipath distortion, ranging from a line-of-sight environment (low-multipath)
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