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Projects/Programs

Displaying 126 - 137 of 137

Thermoelectric Measurements

Ongoing
Thermoelectric effects enable the inter-conversion of thermal and electrical energy, with applications that include solid-state waste heat recovery in engines for automotive and industrial manufacturing; power generation for aerospace, non-terrestrial exploration, and remote sensing; and...

Thin Film Electronics (Archived)

Completed
Today's electronics have reached a point where sheer computation power has yielded to combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society...

Three-Dimensional Nanometer Metrology

Ongoing
Important physical and chemical properties of nanometer scale devices and structures depend on their shape and size. The benefits of nano are already increasing many applications, and are expected to grow significantly. For these applications, measurement accuracy is a fundamental measurement...

Training and optimization of hardware neural networks

Ongoing
The goal of this project is to develop a general method that can train many different types of neural networks, and to demonstrate and evaluate their performance on new emerging hardware. We aim to develop and demonstrate training on diverse hardware platforms, and in the presence of realistic noise...

Transport Property Measurements for Semiconductors and Energy Materials

Ongoing
The image above is an exploded cross section diagram representing the simplified structure layers in a MOSFET transistor. Thermoreflectance (TR) laser-based measurement techniques, a key focus of this project, can measure the thermal properties of substrates, thin films, multilayer structures, and...

Ultrafast Spectroscopy to Advance Microelectronics

Ongoing
Continued advancement in microelectronics, including analog and digital electronics, power electronics, optics and photonics, and micromechanics for memory, processing, sensing, and communications as defined by the OSTP “National Strategy on Microelectronics Research,” requires knowledge of material...

Universal Microscopy Standards

Ongoing
Microscopy standards that are available today have inadequate performance characteristics. As device linewidths decrease toward physical limits, the international roadmap of devices and systems (IRDS) has set uncertainty targets by the year 2025. This target is hard to hit, challenging the industry...

Waveform Measurements of Radars Operating in the 3.5 GHz Band

Ongoing
This NASCTN effort is coordinated with the Department of Defense (DOD), and the results of this project will support the spectrum regulators as they develop a certification process for Spectrum Access Systems (SAS) and the associated Environmental Sensing Capability (ESC) that may be deployed in...

Waveform Metrology Project

Ongoing
Optical measurement techniques: NIST uses the electro-optic sampling (EOS) technique to measure the vector response of photodiodes and provide phase traceability for commercial instrumentation, such as large-signal network analyzers, lightwave component analyzers, vector signal analyzers...

Wireless Systems Metrology

Ongoing
The Wireless Systems Metrology Program supports the growing wireless industry by developing methods to test the operation and functionality of wireless devices in the presence of various types of distortion. This includes multipath distortion, ranging from a line-of-sight environment (low-multipath)...
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