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Projects/Programs

Displaying 1 - 9 of 9

EUV Scatterometry

Ongoing
The state of the art for measurement and inspection of the smallest printed features on an integrated circuits (IC) chip is a combination of electron scanning

Flexible and Printed Electronics

Ongoing
This project is focused on developing the measurement methods and polymer physics models needed to accelerate the innovation cycle for organic semiconductor

Metrology for Nanolithography

Ongoing
Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively evaluate

Polymer Analytics

Ongoing
The Polymer Analytics project was established with the goal of accelerating the discovery of new polymer physics through the development of datasets, methods