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Gaithersburg

Fundamentos de Metrología

Mon, Mar 2 - Fri, Mar 6 2015
El seminario Fundamentos de Metrología presenta al participante los conceptos de sistemas de medición, unidades de

Photons by the Numbers

A NIST team is at work on what promises to be one of the world's most accurate methods for generating a specified number of photons, and has devised a method to

Magnetic Resonance Spectroscopy

Many, if not all, of the performance and reliability metrics of semiconductor devices (power electronics through advanced electronics) have macroscale

Thin Film Electronics (Archived)

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and innovation of

NCCoE Fall Open House

Wed, Oct 15 2014
Join us at NIST's National Cybersecurity Center of Excellence ( NCCoE) for our fall open house, focusing on education
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