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Gaithersburg

Transmission electron microscopy image of a thin cross section of 160 nanometer trenches shows deposited nickel completely filling the features without voids.

NIST-Intel Partnership Workshop

In November, 2014, NIST hosted the seventh in a series of workshops in a NIST-Intel partnership effort on Emerging Nanoscale Interface and Architecture
photo of NISTAR instrument

Taking the Wraps off NISTAR

The NIST Advanced Radiometer (NISTAR), mothballed for more than a decade, is slated to make its space debut very soon about 1.5 million kilometers sunward of
atomic placement options

Computing with Single Atoms

As features on silicon microchips continue to shrink, the final frontier of miniaturization is a transistor on the scale of a single atom – a technology that
Headshots of NIST 2015 APS award winners

Five NIST Scientists Win APS Awards

Five scientists at the National Institute of Standards and Technology (NIST) have won major awards from the American Physical Society, the nation's largest

Advanced Mass Seminar

Mon, Jun 1 - Thu, Jun 11 2015
The 9 day, hands-on seminar focuses on the comprehension and application of the advanced mass procedures, the equations
NASA image of Earth from space

Earth Science: Seeing the Surface Clearly

Satellite observation has revolutionized our understanding of terrestrial conditions and climate dynamics. But the measurement science is extremely demanding
scientists testing ocean color tile

Gauging the Hue of the Sea

The world's oceans face multiple threats, and fisheries, marine biologists, and environmental scientists need accurate and timely data about changing conditions
radiograph of mechanism

Protecting Vacuum Gauges: Patent Pending

PML researchers have applied for a provisional patent on a device to protect expensive "spinning-rotor" high-vacuum gauges – used as transfer standards and

NIST Handbook 133 - 2020 Edition

Checking the Net Contents of Packaged Goods - 2020 as adopted by the 104th National Conference on Weights and Measures 2019 Announcement...
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Contacts

Technical Contact:Mark Stolorow mark.stolorow [at] nist.gov301-975-2754 Registration Contact:Mary Lou Norris marylou.norris [at] nist.gov301-975-2002...
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Dates to Remember

Abstract Submissions Open February 1, 2015 Abstracts Due April 30, 2015 Exhibitor & Sponsorship Opportunities Close EARLY SUMMER 2015...

Exhibitors and Sponsors

Thank you to our Exhibitors and Sponsors! Exhibit Opportunities Exhibit and sponsorship opportunities are available to increase your...

Registration

Registration is closed! Registration closed on 7/10/2015 at 5:00 PM

Technical Program

Symposium Proceedings Schedule at a Glance Full Symposium Agenda Full Symposium Agenda and Abstracts Book Symposium Invited KEYNOTE Speakers...

Technical Tracks

Examples of Errors in Forensic Science Death Investigation Death investigators face the challenge of learning from the decedent only by...

Organizers

Organizers CONFERENCE CHAIR Mark Stolorow, NIST - Symposium Chair TECHNICAL CHAIRS Robert Thompson, NIST - Technical Program Chair Martin...

Welcome

Welcome from the Organizers When you hear the names of exonerated defendants Todd Willingham, Brandon Mayfield, and Earl Washington – what...
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