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Material Measurement Laboratory

Materials Science and Engineering Division

Awards

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NIST Recognized by Microscopy Today

June Lau of NIST, Yimea Zhu of Brookhaven National Lab, and Chunguang Jing, Eric Montgomery, Yubin Zhao, Wade Rush, Ao Liu, and Ilya

Vivek Prabhu named ACS PMSE Fellow

For developing measurements that identify the resolution limit of the chemically amplified photoresists that are used in semiconductor

Dr. Ursula Kattner Honored with 2020 William Hume-Rothery Award

Dr. Kattner received the award for outstanding contributions to the development and application of the multicomponent thermodynamics

2019 - Arthur S. Flemming Award---R. Joseph Kline

For his interdisciplinary research of methods to determine the complex, three-dimensional structure of state-of-the-art microelectronic devices and the molecular structure and orientation of organic electronics materials for flexible electronics.

2019 - Bronze Medal Award---Thomas Gnaupel-Herold, Carelyn Campbell, Michael Katz, Eric Lass, Lyle Levine, Mark Stoudt, Maureen Williams, Fan Zhang, Thien Phan

For identifying improved post-processing treatments for additive manufacturing metal alloys that resolve a critical issue of mechanical part failure.

2019 - Presidential Early Career Award for Scientists and Engineers---Edwin P. Chan

For developing innovative measurement methods that reveal the complex properties of soft polymer films.

Sam Low Recognized by ASTM

For outstanding and sustained contributions to ensuring a strong voice for ASTM International, and coordination with ASTM groups responsible

woman in a blue dress and white sweater stands next to an electron microscope

NIST Microscopy Advance Wins R&D 100 Award

In the Analytical/Test category, for contributions to the development of the Affordable Laser-free Retrofittable Stroboscopic Solution for

Edwin P. Chan Honored with PECASE

For innovative measurement methods that reveal the complex properties of soft polymer films, which are necessary for industry to design and

R. Joseph Kline Honored with Flemming Award

For his outstanding federal service through interdisciplinary research in the evolution of methods to determine the complex, three

Joseph Kline, Daniel Sunday, and Donald Windover

Kline, Sunday, and Windover Honored with Gears of Government Award

The honorees developed and deployed a new dimensional metrology method to solve a critical challenge for the semiconductor industry. The new

2018 - Gold Medal Award---R. Joseph Kline, Daniel Sunday, Donald Windover

For establishing Critical Dimension Small Angle X-ray Scattering as a critical measurement technique for the semiconductor industry.

This is a picture of the awardees of the 2018 ASM Howe Medal

2018 Henry Marion Howe Medal

The Authors received the ASM Henry Marion Howe Medal for 2018 for their paper entitled: “ Formation of the Ni3Nb δ-Phase in Stress

NIST Researchers Receive 2019 ACS National Award

For developing the metrology ecosystem that was critical to improving chemically amplified photoresist formulations, enabling sub-100 nm

2018 ACS PMSE Fellow

Congratulations to Chris Stafford (Functional Polymers Group) for being selected as a Fellow of the Polymeric Materials: Science and

2017 - Colleagues' Choice Award---Maureen Williams

For extraordinary commitment to the NIST mission and significant "above-and-beyond" support of all of her co-workers.

2017 American Physical Society Fellow

Congratulations to Chris Stafford (Functional Polymers Group) for being selected as a Fellow of the American Physical Society for 2017. He

Migler Receives Washington Academy of Sciences Award

Dr. Migler was recognized for the design and application of innovative optical and rheological experimental techniques to definitively

Analytical multimode scanning and transmission electron micrographs of sulfur copolymer-based composite cathodes

Researchers from NIST and the University of Arizona Win Best Paper Award from the Microscopy Society of America

Their submission “Analytical Multimode Scanning and Transmission Electron Imaging and Tomography of Multiscale Structural Architectures of

image of a 3D volume reconstruction of a forest of carbon nanotubes (CNT) embedded in epoxy

Natarajan Wins FEI Image Award

One of the November winners of the 2016 FEI Image Contest

2016 - Bronze Medal Award---Daniel Sunday, R. Joseph Kline

For the development of new X-ray measurements of the structure of self-assembling polymers for advanced lithography in the semiconductor industry.

2016 - Silver Medal Award---Andrew Allen, Lyle Levine

For establishing a revolutionary new technique for measuring materials microstructure and dynamics over multiple scales and under working conditions.

2016 - Bronze Medal Award---Mark Iadicola

For advancing the state of the art in the rigorous use of digital image correlation for sheet-metal-forming limit-curve determination.

2016 - Presidential Early Career Award for Scientists and Engineers---Adam Creuziger

For developing measurement methods for advanced materials needed by the U.S. automotive industry to manufacture lightweight vehicles, providing metallurgical expertise to government agencies, and contributing to science education and international clean water programs.

2014 - Bronze Medal Award---Thomas Gnaupel-Herold, Adam Creuziger

For the development of new analysis techniques for error determinations of crystallographic phase fractions, textures, and intergranular stresses.

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