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Search Publications by Albert F. Rigosi

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Displaying 1 - 25 of 40

Graphene quantum Hall effect devices for AC and DC resistance metrology

Author(s)
Mattias Kruskopf, Dinesh K. Patel, Chieh-I Liu, Albert F. Rigosi, Randolph E. Elmquist, Yicheng Wang, Stefan Bauer, Yefei Yin, Klaus Pierz, Eckard Pesel, Martin Goetz, Jurgen Schurr
The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample

AC and DC Quantized Hall Array Resistance Standards

Author(s)
Randolph E. Elmquist, Mattias Kruskopf, Dinesh K. Patel, I Fan Hu, Chieh-I Liu, Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Dean G. Jarrett
Quantized Hall array resistance standards (QHARS) span values from 100 (ohm) to 1 M(ohm) and demonstrate precision approaching that of single devices. This

Advanced Temperature-Control Chamber for Resistance Standards

Author(s)
Shamith U. Payagala, Alireza R. Panna, Albert F. Rigosi, Dean G. Jarrett
Calibration services for resistance metrology have continued to advance their capabilities and establish new and improved methods for maintaining standard

A self-assembled graphene ribbon grown on SiC

Author(s)
Bi Y. Wu, Yanfei Yang, Albert F. Rigosi, Jiuning Hu, Hsin Y. Lee, Guangjun Cheng, Vishal Panchal, Mattias Kruskopf, Hanbyul Jin, Kenji Watanabe, Takashi Taniguchi, David B. Newell, Randolph E. Elmquist, Chi-Te Liang

Dielectric properties of Nb_{x}W_{1-x}Se_{2} alloys

Author(s)
Albert F. Rigosi, Heather M. Hill, Sergiy Krylyuk, Nhan V. Nguyen, Angela R. Hight Walker, Albert Davydov, David B. Newell
The growth of transition metal dichalcogenide (TMDC) alloys provides an opportunity to experimentally access information elucidating how optical properties

Utilizing confocal laser scanning microscopy for rapid optical characterization of graphene

Author(s)
Vishal Panchal, Yanfei Yang, Guangjun Cheng, Jiuning Hu, Mattias Kruskopf, Chieh-I Liu, Albert F. Rigosi, Christos Melios, Angela R. Hight Walker, David B. Newell, Olga Kazakova, Randolph E. Elmquist
Confocal laser scanning microscopy (CLSM) is a non-destructive, highly-efficient optical characterization method for large-area analysis of graphene on