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Optimization of Wye-Δ-Type Quantum Hall Resistance Standard

Published

Author(s)

Yanfei Yang, Dean G. Jarrett, Alireza Panna, Albert Rigosi, David B. Newell, Randolph Elmquist, Cheng Hsueh Yang, Ngoc Thanh Mai Tran

Abstract

Theoretically wye-delta transformation can be used to realize ultra-high resistances up to PΩ. For graphene-based quantum Hall array resistance standards fabricated to utilize the wye-delta transformation, a few challenges present themselves, including the unique quantized resistance in a graphene Hall bar and the limitation of the area of homogeneous high-quality graphene. In this paper, we discuss approaches to optimize the transformation with quantum Hall resistance standard and propose a dual-output prototype for 1 MΩ and 100 MΩ for future fabrication.
Proceedings Title
2024 Conference on Precision Electromagnetic Measurements Digest
Conference Dates
July 6-11, 2024
Conference Location
Denver, CO, US
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

dual-source bridge, wye-delta transformation, quantum Hall array resistance standards, dual-output

Citation

Yang, Y. , Jarrett, D. , Panna, A. , Rigosi, A. , Newell, D. , Elmquist, R. , Yang, C. and Tran, N. (2024), Optimization of Wye-Δ-Type Quantum Hall Resistance Standard, 2024 Conference on Precision Electromagnetic Measurements Digest, Denver, CO, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957526 (Accessed October 7, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 30, 2024, Updated September 20, 2024