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Search Publications by: Paul D. Hale (Fed)

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Displaying 51 - 75 of 116

Traceable waveform calibration with a covariance-based uncertainty analysis

October 1, 2009
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Arkadiusz C. Lewandowski, Tracy S. Clement, Darryl A. Keenan
We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in themeasured waveform. The calibration includes an equivalent-circuit model of the generator that can be used to determine how the

Uncertainty of timebase corrections

October 1, 2009
Author(s)
Chih-Ming Wang, Paul D. Hale, Dylan F. Williams
We develop a covariance matrix describing the uncertainty of a new timebase for waveform measurements determined with the National Institute of Standards and Technology's timebase correction algorithm. This covariance matrix is used with covariance

Novel nano-structured Metal-Semiconductor-Metal photodetector with high peak voltage

June 22, 2009
Author(s)
Paul D. Hale, Dylan F. Williams, Tomoko Borsa, B. J. VanZeghbroeck
A novel nano-structured metal-semiconductor-metal photodetector consisting of interdigitated metal fingers and nanodots is successfully fabricated on a semi-insulating GaAs substrate by electron beam lithography, and integrated with an on-chip ground

A transmitter for calibrating the extinction ratio of optical receivers

March 20, 2009
Author(s)
Jeffrey A. Jargon, Xiaoxia Wu, Paul D. Hale, Klaus M. Engenhardt, Alan Willner
We describe a transmitter being developed at the National Institute of Standards and Technology for calibrating extinction ratio measurements of optical receivers. Preliminary measurement results are presented, and major uncertainty components are

Calculation of pulse parameters and propagation of uncertainty

March 1, 2009
Author(s)
Paul D. Hale, Chih-Ming Wang
The fundamental starting point for the analysis of all two-state waveforms is the determination of the low- and highstate levels. This is a two-step process. First, the data are grouped into points belonging to each state, and second, the value of each

A robust algorithm for eye-diagram analysis

November 1, 2008
Author(s)
Jeffrey A. Jargon, Paul D. Hale, Chih-Ming Wang
We present a new method for analyzing eye diagrams that always provides a unique solution by making use of a robust, least-median-of-squares (LMS) location estimator. In contrast to commonly used histogram techniques, the LMS procedure is insensitive to

Complete waveform characterization at NIST

June 8, 2008
Author(s)
Paul D. Hale, Tracy S. Clement, Darryl A. Keenan, Dylan F. Williams, Arkadiusz C. Lewandowski, C. M. Wang, Andrew Dienstfrey
We present a method for calibrating the voltage a pulse generator delivers to a load at every point in the measured waveform epoch. The calibration includes an equivalent circuit model of the generator so that the user can calculate how the generator will

Comb-Generator Characterization

February 1, 2008
Author(s)
Howard C. Reader, Dylan Williams, Paul D. Hale, Tracy S. Clement
We characterize a 50 GHz comb generator measured on a sampling oscilloscope. With careful control of the input power, input harmonics and comb generator temperature, we find the output spectrum to be stable to 0.1 dB and 0.5 degrees. We correct results for

Absolute Magnitude and Phase Calibrations

October 1, 2007
Author(s)
Kate Remley, Paul D. Hale, Dylan Williams
In VNA measurements, the magnitude and phase of a transmitted or reflected wave are measured relative to that of the incident wave. VNA measurements are made a single frequency at a time and each frequency component is acquired relative to the internally

Systematic Error of the Nose-to-Nose Sampling-Oscilloscope Calibration

September 1, 2007
Author(s)
Dylan Williams, Tracy S. Clement, Kate Remley, Paul D. Hale, F. Verbeyst
We use traceable swept-sine and electrooptic-sampling-system-based-sampling-oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to

The Sampling Oscilloscope as a Microwave Instrument

August 1, 2007
Author(s)
Dylan Williams, Paul D. Hale, Kate Remley
Many modern high-speed oscilloscopes are well suited for precise microwave waveform, modulated-signal, and nonlinear measurements. These oscilloscopes have bandwidths of up to 100 GHz and are available with nominally 50 ? input impedances. Like their low

Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes

December 1, 2006
Author(s)
Paul D. Hale, C. M. Wang, Dylan Williams, Kate Remley, Joshua Wepman
In this paper, a method of correcting both random and systematic timebase errors using measurements of only two quadrature sinusoids made simultaneously with a waveform of interest is described. The authors estimate the fundamental limits to the procedure

Terminology for High-Speed Sampling-Oscilloscope Calibration

December 1, 2006
Author(s)
Dylan Williams, Tracy S. Clement, Paul D. Hale, Andrew Dienstfrey
We discuss procedures for calibrating high-speed sampling oscilloscopes at the National Institute of Standards and Technology, and the terminology associated with those calibrations. The discussion clarifies not only the calibration procedures, but how to

Minimum-Phase Calibration of Sampling Oscilloscopes

August 15, 2006
Author(s)
Andrew M. Dienstfrey, Paul D. Hale, Darryl A. Keenan, Tracy S. Clement, Dylan F. Williams
We describe an algorithm for determining the minimum phase of a linear time-invariant response function from its magnitude. The procedure is based on Kramers Kronig relations in combination with auxiliary direct measurements of the desired phase response

Calibration of Sampling Oscilloscopes With High-Speed Photodiodes

August 1, 2006
Author(s)
Tracy S. Clement, Paul D. Hale, Dylan Williams, C. M. Wang, Andrew Dienstfrey, Darryl A. Keenan
We calibrate the magnitude and phase response of equivalent-time sampling oscilloscopes to 110 GHz. We use a photodiode that has been calibrated with our electrooptic sampling system as a reference input pulse source to the sampling oscilloscope. We

Minimum-phase calibration of sampling oscilloscopes

August 1, 2006
Author(s)
Andrew Dienstfrey, Paul D. Hale, Darryl A. Keenan, Tracy S. Clement, Dylan Williams
We describe an algorithm for determining the minimum phase of a linear, time-invariant response function from its magnitude. The procedure is based on Kramers-Kronig relations in combination with auxiliary direct measurements of the desired phase response

Sampling-Oscilloscope Measurement of a Microwave Mixer With Single-Digit Phase Accuracy

March 1, 2006
Author(s)
Dylan F. Williams, Hassen Khenissi, Fabien Ndagijimana, Catherine A. Remley, Joel Dunsmore, Paul D. Hale, Jack Wang, Tracy S. Clement
We describe a straightforward method of separately characterizing up-conversion and down-conversion in microwave mixers with a sampling oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base

Covariance-Based Uncertainty Analysis of the NIST Electrooptic Sampling System

January 1, 2006
Author(s)
Dylan F. Williams, Arkadiusz C. Lewandowski, Tracy S. Clement, C. M. Wang, Paul D. Hale, Juanita M. Morgan, Darryl A. Keenan, Andrew Dienstfrey
We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology's electro-optic sampling system. This description offers a general way of describing the

Electromagnetic Signatures of WLAN Cards and Network Security

December 21, 2005
Author(s)
Catherine A. Remley, Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Paul D. Hale, Michael McKinley, Emmanouil Antonakakis, A Karygiannis
The proliferation of wireless devices and the availability of new wireless applications and services raise new privacy and security concerns. Although network-layer anonymity protects the identities of the communication endpoints, the physical layer of

Calibrated 200 GHz Waveform Measurement

April 1, 2005
Author(s)
Dylan Williams, Paul D. Hale, Tracy S. Clement
We develop a method for mismatch-correcting temporal waveforms measured with a high-speed electro-optic sampling system. The new calibration characterizes the source in both the time and frequency domains, and accounts for all impedances and multiple

NIST Optoelectronic Measurements for Fiber Optic Applications

March 1, 2005
Author(s)
Kent B. Rochford, Paul D. Hale, Nathan R. Newbury
We describe current measurement capabilities as well as research focused on two areas: improving temporal and frequency response characterization of detectors and instrumentation using electro-optic sampling, and improving wavelength metrology using

Uncertainty of the NIST Electrooptic Sampling System

December 1, 2004
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement
We present an uncertainty analysis of measurements performed with NIST's electrooptic sampling system. The system measures the voltage waveform injected by a photodetector on a coplanar waveguide fabricated on an electrooptic LiTaO3 wafer. The frequency

Adaptive Characterization of Jitter Noise in Sampled High-Speed Signals

October 1, 2003
Author(s)
Kevin J. Coakley, Chih-Ming Wang, Paul D. Hale, Tracy S. Clement
We estimate the root-mean-square (RMS) value of timing jitter noise in simulated signals similar to measured high-speed sampled signals. The simulated signals are contaminated by additive noise, timing jitter noise, and time shift errors. Before estimating