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Displaying 1 - 25 of 47

Calibration of free-space and fiber-coupled single-photon detectors

September 14, 2020
Author(s)
Thomas Gerrits, Alan L. Migdall, Joshua C. Bienfang, John H. Lehman, Sae Woo Nam, Oliver T. Slattery, Jolene D. Splett, Igor Vayshenker, Chih-Ming Wang
We present our measurements of the detection efficiency of free-space and fiber-coupled single- photon detectors at wavelengths near 851 nm and 1533.6 nm. We investigate the spatial uniformity of one free-space-coupled silicon single-photon avalanche diode

Calibration of free-space and fiber-coupled single-photon detectors

December 20, 2019
Author(s)
Thomas Gerrits, Alan L. Migdall, Joshua C. Bienfang, John H. Lehman, Sae Woo Nam, Jolene D. Splett, Igor Vayshenker, Chih-Ming Wang
We measure the detection efficiency of single-photon detectors at wavelengths near 851 nm and 1533.6 nm. We investigate the spatial uniformity of one free-space-coupled single-photon avalanche diode and present a comparison between fusion-spliced and

Optical-Fiber Power Meter Comparison between NIST and LAMETRO

November 1, 2019
Author(s)
Johnny Jimenez, Maria Ugalde, John H. Lehman, Igor Vayshenker
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Laboratorio de Metrologia, Instituto Costarricense de Electricidad (LAMETRO-ICE, COSTA RICA) for optical fiber-based

Cryogenic Primary Standard for Optical Fibre Power Measurement

August 17, 2018
Author(s)
Malcolm G. White, Zeus Ruiz, Christopher S. Yung, Igor Vayshenker, Nathan A. Tomlin, Michelle S. Stephens, John H. Lehman
NIST has completed commissioning a new, state-of-the-art cryogenic primary standard for optical fibre power measurement and calibration. It establishes for the first time, a direct traceability route between the device under test and primary standard. Two

Characterisation of New Planar Radiometric Detectors using Carbon Nanotube Absorbers under Development at NIST

June 13, 2018
Author(s)
Malcolm G. White, Nathan A. Tomlin, Christopher S. Yung, Michelle S. Stephens, Ivan Ryger, Solomon I. Woods, John H. Lehman, Igor Vayshenker
Carbon nanotube technology, in conjunction with silicon micro-fabrication techniques, has enabled us to develop planar radiometric detectors, which has led to the establishment of a new generation of primary standards. The goal is to develop compact, fast

Verification of Calibration Methods for Determining Photon-Counting Detection Efficiency using Superconducting Nano-Wire Single Photon Detectors

September 4, 2017
Author(s)
Igor Vayshenker, Robert D. Horansky, John H. Lehman, Malcolm G. White, Sae Woo Nam, Ingmar Mueller, Lutz Werner, G. Wuebbeler
In the recent years several ways to radiometrically calibrate optical fiber-coupled detectors have been developed. However, fiber-coupled calibration methods for single photon detectors have not been compared by national metrology institutes validating the

Bandwidth-enhanced superconducting nanowire single photon detectors for telecom wavelengths

May 13, 2017
Author(s)
Stephan Krapick, Marina Hesselberg, Varun Verma, Igor Vayshenker, Sae Woo Nam, Richard Mirin
We present a single-photon detector providing system detection efficiencies of at least (86.7 ± 0.9) % from 1450 nm to 1640 nm. It comprises bilayer superconducting WSi nanowires in conjunction with all-dielectric structures for optical impedance matching

High-efficiency superconducting nanowire single-photon detectors fabricated from MoSi thin-films

December 22, 2015
Author(s)
Varun B. Verma, Boris Korzh, Felix Bussieres, Robert D. Horansky, Shellee D. Dyer, Adriana E. Lita, Igor Vayshenker, Francesco Marsili, Matthew D. Shaw, Hugo Zbinden, Richard P. Mirin, Sae Woo Nam
We report on MoSi SNSPDs which achieved high system detection efficiency (87.1 ± 0.5% at 1542 nm) at 0.7 K and we demonstrate that these detectors can also be operated with saturated internal efficiency at a temperature of 2.3 K in a Gifford-McMahon

High-efficiency superconducting nanowire single-photon detectors fabricated from MoSi thin-films

April 10, 2015
Author(s)
Varun B. Verma, Boris Korzh, Felix Bussieres, Robert D. Horansky, Shellee D. Dyer, Adriana E. Lita, Igor Vayshenker, Francesco Marsili, Matthew D. Shaw, Hugo Zbinden, Richard P. Mirin, Sae Woo Nam
We demonstrate high-efficiency superconducting nanowire single-photon detectors (SNSPDs) fabricated from MoSi thin-films. We measure a maximum system detection efficiency (SDE) of 87 ± 0.5 % at 1542 nm at a temperature of 0.7 K, with a jitter of 76 ps

Detecting Single Infrared Photons with 93 % System Efficiency

February 25, 2013
Author(s)
Francesco F. Marsili, Varun B. Verma, Jeffrey A. Stern, Sean D. Harrington, Adriana E. Lita, Thomas Gerrits, Igor Vayshenker, Burm Baek, Matthew D. Shaw, Richard P. Mirin, Sae Woo Nam
Single-photon detectors (SPDs) are nonlinear transducers that respond to the absorption of one or more photons with an electrical signal1. SPDs at near infrared wavelengths with high system detection efficiency (> 90%), low dark count rate (

International comparisons of optical fiber power measurements

September 19, 2011
Author(s)
Igor Vayshenker, David J. Livigni, Xiaoyu X. Li, John H. Lehman
We discuss the results of optical fiber power meter (OFPM) measurements at 1310 and 1550 nm made by NIST and seven national measurement institutes (NMIs). We also describe transfer standards and the associated uncertainties. The comparisons show a

Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent

April 25, 2011
Author(s)
Aaron J. Miller, Adriana Lita, Brice R. Calkins, Igor Vayshenker, Stephen Gruber, Sae Woo Nam
We present a compact packaging technique for coupling light from a single-mode telecommunication fiber to cryogenic singlephoton sensitive devices. Our single-photon detectors are superconducting transition-edge sensors (TESs) with a collection area only a

Optical fiber power meter comparison between NIST and NIM

November 1, 2010
Author(s)
Igor Vayshenker, Jian Li, L. M. Xiong, Z. X. Zhang, David J. Livigni, Xiaoyu X. Li, John H. Lehman
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and National Institute of Metrology (NIM-China). We report optical fiber-based power measurements at nominal wavelengths of

Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nm

December 23, 2009
Author(s)
Igor Vayshenker, Shao Yang, Kuniaki Amemiya, Seiji Mukai, T. Zama
We compare the results of measurements of the nonlinearity of high-power optical fiber powermeters (OFPMs) by two national metrology institutes (NMIs): the National Institute of Standards and Technology (NIST-USA) and the National Metrology Institute of

International comparisons of optical fiber power measurements

October 1, 2008
Author(s)
Igor Vayshenker, David J. Livigni, Xiaoyu X. Li, John H. Lehman
We discuss the results of optical fiber power meter (OFPM) measurements at 1302 and 1546 nm made by NIST and six national measurement institutes (NMIs). We also describe transfer standards and the associated uncertainties. The comparisons show a reasonably

Bilateral optical power meter comparison between NIST and CENAM

July 1, 2008
Author(s)
Igor Vayshenker, J. Bermudez, J. Molina, Z. Ruiz, David J. Livigni, Xiaoyu X. Li, John H. Lehman
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrologia (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at

Bilateral optical fiber power meter linearity comparison between NMIJ and NIST

June 8, 2008
Author(s)
Seiji Mukai, Kuniaki Amemiya, Michiyuki Endo, Igor Vayshenker, Xiaoyu X. Li, Shao Yang
Optical fiber power meter (OFPM) linearity standards of NMIJ (Japan) and NIST (USA) are compared using a commercial OFPM as a transfer standard at 1310 nm and 1550 nm over a power range [-60 dBm, 0 dBm]. At both wavelengths the comparison indicates an

NIST optical fiber power measurements: intramural and international comparisons

October 1, 2007
Author(s)
Igor Vayshenker, John H. Lehman, David J. Livigni, Joshua A. Hadler
We discuss the results of intramural comparisons of NIST laser and optical fiber power meter (OFPM) measurements, and the results of OFPM comparisons between NIST and three National Measurement Institutes (NMIs). We also describe transfer standards

Trilateral optical powermeter comparison between NIST, NMIJ/AIST, and METAS

February 10, 2007
Author(s)
Igor Vayshenker, John H. Lehman, David J. Livigni, Xiaoyu X. Li, Kuniaki Amemiya, Daiji Fukuda, Seiji Mukai, Shinji Kimura, Michiyuki Endo, Jacques Morel, Armin Gambon
We describe the results of a comparison of reference standards between three National Metrology Institutes: the National Institute of Standards and Technology (NIST, USA), the National Metrology Institute of Japan/National Institute of Advanced Industrial

Connector-induced offsets in optical fiber power meters

August 20, 2006
Author(s)
Igor Vayshenker, Xiaoyu X. Li, Darryl A. Keenan
We discuss issues related to calibration of optical fiber power meters. The power readings may vary when using various types of fiber connectors, or even the same type of connectors made by different vendors. We study the connector effects by calibrating

Nonlinearity of high-power optical fiber power meters at 1480 nm

February 20, 2006
Author(s)
Igor Vayshenker, Shao Yang, Ralph Swafford
We describe a calibration system that measures the nonlinearity of optical fiber power meters (OFPMs) at a maximum power of 0.6 W and a minimum power of 0.2 mW at 1480 nm. The system is based on the triplet superposition method. This system measures the

High-power nonlinearity of optical fiber power meters at 1474 nm

May 11, 2005
Author(s)
Igor Vayshenker, Ralph Swafford, Shao Yang
We have developed a system to measure the nonlinearity of optical fiber power meters (OFPMs) at a maximum power of 0.6 W at 1474 nm. The system is based on the triplet superposition method. This system measures nonlinearity of OFPMs using correction