Trilateral optical powermeter comparison between NIST, NMIJ/AIST, and METAS
Igor Vayshenker, John H. Lehman, David J. Livigni, Xiaoyu X. Li, Kuniaki Amemiya, Daiji Fukuda, Seiji Mukai, Shinji Kimura, Michiyuki Endo, Jacques Morel, Armin Gambon
We describe the results of a comparison of reference standards between three National Metrology Institutes: the National Institute of Standards and Technology (NIST, USA), the National Metrology Institute of Japan/National Institute of Advanced Industrial Science and Technology (NMIJ/AIST, Japan), and the Federal Office of Metrology (METAS, Switzerland). Open-beam- (free field) and optical-fiber-based measurements at wavelengths of 1302 and 1546 nm are reported. Three laboratories' reference standards are compared by means of two temperature-controlled, optical trap detectors. Measurement results showed largest differences of less than 4.2 parts in 103, which is within the expanded (k=2) uncertainty for the laboratories' reference standards.