Optical fiber power meter comparison between NIST and NIM
Igor Vayshenker, Jian Li, L. M. Xiong, Z. X. Zhang, David J. Livigni, Xiaoyu X. Li, John H. Lehman
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and National Institute of Metrology (NIM-China). We report optical fiber-based power measurements at nominal wavelengths of 1310 and 1550 nm. We compare the laboratories reference standards by means of a commercial optical power meter. Measurement results showed the largest difference of less than 2.6 parts in 103, which is within the combined standard (k=1) uncertainty for the laboratories reference standards.