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Search Publications by Joshua B Martin

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Displaying 1 - 24 of 24

Structural, chemical, electrical and thermal properties of n-type NbFeSb

Author(s)
Dean Hobbis, Raphael P. Hermann, Hsin Wang, David S. Parker, Tribhuwan Pandey, Joshua B. Martin, Katharine L. Page, George S. Nolas
We report on the structural, chemical, electrical and thermal properties of n-type polycrystalline NbFeSb synthesized by induction melting of the elements

High Throughput Screening Tools for Thermoelectric Materials

Author(s)
Winnie K. Wong-Ng, Yonggao Yan, Makoto Otani, Joshua B. Martin, Kevin R. Talley, Sara C. Barron, David L. Carroll, C Hewitt, Howard Joress, Evans L. Thomas, Martin L. Green, Xinfeng Tang
A suite of complementary high-throughput screening systems for combinatorial films was developed at NIST to facilitate the search for efficient thermoelectric

Bi2Te3 and Bi2Te3-xSx FOR THERMOELECTRIC APPLICATIONS

Author(s)
Winnie K. Wong-Ng, N D. Lowhorn, Joshua B. Martin, Peter Zavalij, Howard Joress, Qingzhen Huang, Yonggao Y. Yan, Azzam Mansour, Evans L. Thomas, Jihui Yang, Martin L. Green
The increased interest in research and development on thermoelectric materials is partly due to the need for improved efficiency in the global utilization of

Development of a Seebeck Coefficient Standard Reference Material (SRM)™

Author(s)
Nathan Lowhorn, Winnie K. Wong-Ng, John Lu, Joshua B. Martin, Martin L. Green, John E. Bonevich, Evan L. Thomas, Neil Dilley, Jeff Sharp
We have successfully developed a Seebeck coefficient Standard Reference Material (SRM™), Bi2Te3, that is essential for interlaboratory data comparison and for

APPLICATIONS OF HIGH-THROUGHPUT SCREENING TOOLS FOR THERMOELECTRIC MATERIALS

Author(s)
Winnie K. Wong-Ng, Howard L. Joress, Joshua B. Martin, Yonggao Y. Yan, Jihui Yang, Makoto Otani, Evan L. Thomas, Martin L. Green, Jason Hattrick-Simpers
The increased research and development on thermoelectric materials in recent years has been driven primarily by the need for improved efficiency in the global

High Temperature Seebeck Coefficient Metrology

Author(s)
Joshua B. Martin, Terry M. Tritt, Winnie K. Wong-Ng, Ctirad Uher
We present an overview of the challenges and practices of thermoelectric metrology at high temperature (300 K-1300 K). The Seebeck coefficient, when combined

Recent Developments in Thermoelectric Metrology at NIST

Author(s)
Winnie K. Wong-Ng, Joshua B. Martin, Nathan Lowhorn, Makoto Otani, Evan L. Thomas, Martin L. Green, Jason Hattrick-Simpers, Yonggao Y. Yan, Thanh Tran, Jihui Yang
We have successfully developed several important thermoelectric metrologies in recent years at NIST. First, a low temperature (10 K to 390 K) Seebeck

Statistical analysis of a round-robin measurement survey of two candidate materials for a Seebeck coefficient Standard Reference Material

Author(s)
John Lu, Nathan Lowhorn, Winnie K. Wong-Ng, Weiping Zhang, Evan L. Thomas, Makoto Otani, Martin L. Green, Thanh N. Tran, Chris Caylor, Neil Dilley, Adams Downey, B Edwards, Norbert Elsner, S Ghamaty, Timothy Hogan, Qing Jie, Qiang Li, Joshua B. Martin, George S. Nolas, H Obara, Jeffrey Sharp, Rama Venkatasubramanian, Rhonda Willigan, Jihui Yang, Terry Tritt
In an effort to develop a Standard Reference Material (SRM ) for Seebeck coefficient, we have conducted a round-robin measurement survey of two candidate