U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by:

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 26 - 50 of 51

Measurement of residual stress field anisotropy at indentations in silicon

June 23, 2010
Author(s)
Yvonne B. Gerbig, Stephan J. Stranick, Robert F. Cook
The residual stress field around spherical indentations on single crystal silicon (Si) of different crystallographic orientation is mapped by confocal Raman microscopy. All orientations exhibit an anisotropic stress pattern with an orientation specific

Sounds of Atoms: Life in Science

October 10, 2008
Author(s)
Stephan J. Stranick
Early in setting up our nanoscience laboratory at Penn State, we were frustrated because we could not peer into the tunneling junctions of our scanning tunneling microscopes (STMs) to see what the atoms were doing. We were particularly vexed when singular

Programmable Vector Point-Spread Function Engineering

April 1, 2006
Author(s)
M R. Beversluis, L Novotny, Stephan J. Stranick
We use a nematic liquid crystal spatial light modulator (SLM) to control the vector point spread function of a microscope objective by manipulating the pupil field polarization. In combination with an achromatic quarter-wave plate, the SLM acts as a

Horizontal Growth and In Situ Assembly of Oriented Zinc Oxide Nanowires

October 1, 2004
Author(s)
Babak Nikoobakht, Chris A. Michaels, Stephan J. Stranick, Mark D. Vaudin
The positioning and directed assembly of semiconductor nanowires (NWs) is of considerable current interest for bottom-up approaches to the engineering of intricate structures from nanoscale building blocks. We report a horizontal growth mode for ZnO NWs on

Template Fabrication of Protein-Functionalized Gold-Polypyrrole-Gold Segmented Nanowires

September 1, 2004
Author(s)
R M. Hernandez, Lee J. Richter, Stephen Semancik, Stephan J. Stranick, Thomas E. Mallouk
Gold nanowires containing protein-modified poly(pyrrole) (Ppy) junctions were synthesized electrochemically using porous aluminum oxide as a template. The effects of the conditions of electrochemical synthesis on Ppy growth and protein (avidin or

Controlling The Growth Direction of ZnO Nanowires (NWs) on c and a -Plane Sapphire

February 1, 2004
Author(s)
Babak Nikoobakht, Albert Davydov, Stephan J. Stranick
The issue of controlling the growth direction of NWs is vital in nanotechnology applications and future optoelectronic devices. In an effort to address the above, we have begun studies aimed at selectively controlling the growth direction of horizontal

Modeling Illumination-Mode Near-Field Optical Microscopy of Au Nanoparticles

March 1, 2001
Author(s)
A Liu, A Rahmani, Garnett W. Bryant, Lee J. Richter, Stephan J. Stranick
We present a theoretical analysis of near-field scanning optical microscopy (NSOM) images of small Au particles made in illumination mode. We model the metal-coated fiber tip as a thin disk consisting of a glass core and an aluminum coating. An external

Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NSOM

Scanning Near-Field Infrared Microscopy and Spectroscopy With a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
A scanning near-field microscopy that allows the fast acquisition of mid-infrared absorption spectra is described. The microscope couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of vibrational

Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy

September 1, 2000
Author(s)
Chris A. Michaels, C E. Dentinger, Lee J. Richter, D B. Chase, Richard R. Cavanagh, Stephan J. Stranick
Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface

Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images

August 1, 1999
Author(s)
Lee J. Richter, C E. Dentinger, Richard R. Cavanagh, Garnett W. Bryant, A Liu, Stephan J. Stranick, C D. Keating, M J. Natan
We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This dependence is

Nanoscale Chemical Imaging With Scanning Near-Field Infrared Microscopy

June 1, 1999
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
The development of a near-field microscope that utilizes infrared absorption as the optical contrast mechanism will be described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope

July 1, 1998
Author(s)
Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
We have developed a near-field scanning optical microscope that provides simultaneous transmission and reflection mode measurements while concurrently recording a topograph of the sample surface. In this microscope design, an ellipsoidal cavity is used to
Was this page helpful?