Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images

Published

Author(s)

Lee J. Richter, C E. Dentinger, Richard R. Cavanagh, Garnett W. Bryant, A Liu, Stephan J. Stranick, C D. Keating, M J. Natan

Abstract

We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This dependence is consistent with theoretical models which are in good agreement with the experimental images. Probes with thick coatings (~ ) produce images consisting of three extreme, due to a resonance-like polarization of the probe end. Probes with thinner coatings generally produce simpler images. However, in some cases the images contain wave-like structures due to interference between the direct radiation from the tip and propagating tip fields scattered by the particles.
Citation
Journal of the Optical Society of America A-Optics Image Science and Vision
Volume
16
Issue
8

Keywords

discrete-dipole model, nanoparticle, near-field optical microscopy

Citation

Richter, L. , Dentinger, C. , Cavanagh, R. , Bryant, G. , Liu, A. , Stranick, S. , Keating, C. and Natan, M. (1999), Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images, Journal of the Optical Society of America A-Optics Image Science and Vision (Accessed June 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 1999, Updated February 19, 2017