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High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope

Published

Author(s)

Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh

Abstract

We have developed a near-field scanning optical microscope that provides simultaneous transmission and reflection mode measurements while concurrently recording a topograph of the sample surface. In this microscope design, an ellipsoidal cavity is used to collect and re-image the light reflected from a near-field optic. Re-imaging of the near-field optic away from the mechanical components of the microscope elimates any hindrance that they would otherwise cause. The near-field optical microscope configuration described in this paper allows for the efficient, symmetric collection of reflected and transmitted light. This instrumental design has been optimized for chemical problems that require molecular characterization on the nanometer scale. Images of {difference} 100 nm Au particles demonstrate the utility of this instrument.
Citation
Journal of Vacuum Science and Technology B
Volume
16
Issue
No. 4

Keywords

near field, scanning optical microscope

Citation

Stranick, S. , Richter, L. and Cavanagh, R. (1998), High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope, Journal of Vacuum Science and Technology B (Accessed May 25, 2024)

Issues

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Created July 1, 1998, Updated February 17, 2017