Publications

Displaying 1 - 25 of 196

Photoresist latent and developer images as probed by neutron reflectivity methods

September 16, 2010

Author(s)

Vivek M. Prabhu, Shuhui Kang, David L. VanderHart, Eric K. Lin, Wen-Li Wu

Photoresist materials enable the fabrication of advanced integrated circuits with ever decreasing feature sizes. As next-generation light sources are developed

Measuring the extent of phase separation in P3HT/PCBM photovoltaic blends with 1H spin diffusion NMR spectroscopy

April 5, 2010

Author(s)

Ryan C. Nieuwendaal, Chad R. Snyder, Regis J. Kline, Eric K. Lin, David L. VanderHart, Dean M. DeLongchamp

Thin Film Solid State Proton NMR Measurements Using A Synthetic Mica Substrate: Polymer Blends

August 25, 2009

Author(s)

David L. VanderHart, Vivek M. Prabhu, Kristopher Lavery, Cindi L. Dennis, Ashwin Rao, Eric K. Lin

We demonstrate that a synthetic fluorophlogopite mica can be used as a proton-free, diamagnetic substrate for examining solid thin-film samples using

Methodology for quantitative measurements of multilayer polymer thin films with IR spectroscopic ellipsometry

July 2, 2009

Author(s)

Shuhui Kang, Vivek M. Prabhu, Christopher L. Soles, Eric K. Lin, Wen-Li Wu

A new methodology to quantify the sensitivity and resolution of infrared variable angle spectroscopic ellipsometry (IRSE) measurements was developed for probing

Low-temperature plasma assisted nanotransfer printing between thermoplastic polymers

March 26, 2009

Author(s)

Deuk Y. Lee, Daniel R. Hines, Christopher M. Stafford, Christopher L. Soles, Eric K. Lin, Gottlieb Oehrlein

we performed a survey of the factors controlling the changes of the adhesion characteristics for PMMA and PET surfaces upon plasma activation of the respective

Controlling the Formation and Orientation of Terraced Nanoscale Ribbons of a Thiophene-Based Copolymer

March 24, 2009

Author(s)

Dean M. DeLongchamp, Regis J. Kline, Youngsuk Jung, David Germack, Eric K. Lin, Andrew Moad, Lee J. Richter, Michael F. Toney, Martin Heeney, Iain McCulloch

Terraced nanoscale ribbon domains of a poly(2,5-bis(3-alkylthiophen-2-yl) thieno[3,2-b]thiophene) form after thin films are cooled from its highest-temperature

Small Angle X-Ray Scattering Measurements of Spatial Dependent Linewidth in Dense Nanoline Gratings

March 16, 2009

Author(s)

Chengqing C. Wang, Wei-En Fu, Bin Li, Huai Huang, Christopher L. Soles, Eric K. Lin, Wen-Li Wu, Paul S. Ho, Michael W. Cresswell

Small angle X-ray scattering (SAXS) was used to characterize the line cross section of nanoline gratings fabricated using electron beam lithography (EBL)

Characterization of the Photoacid Diffusion Length

February 27, 2009

Author(s)

Shuhui Kang, Vivek M. Prabhu, Wen-Li Wu, Eric K. Lin, Kwang-Woo Choi, Manish Chandhok, Todd Younkin, Wang Yueh

The photoacid diffusion length is a critical issue for EUV photoresists and photolithography because it governs critical dimension (CD), line-edge-roughness

The molecular basis of mesophase ordering in a thiophene-based copolymer

February 18, 2009

Author(s)

Dean M. DeLongchamp, Regis J. Kline, Youngsuk Jung, Eric K. Lin, Daniel A. Fischer, David J. Gundlach, Andrew Moad, Lee J. Richter, Michael F. Toney, Martin Heeney, Iain McCulloch

The carrier mobility of poly(2,5-bis(3-alkylthiophen-2-yl) thieno[3,2-b]thiophene) semiconductors can be substantially enhanced after heating through a

Well-Ordered Polymer Melts with 5 nm Lamellar Domains from Blends of a Disordered Block Copolymer and a Selectively Associating Homopolymer of Low or High Molar Mass

October 16, 2008

Author(s)

Vijay Tirumala, August W. Bosse, Eric K. Lin, Vikram Daga, Alvin Romang, Jan Ilavsky, J J. Watkins

The use of short chain block copolymer melts as nanostructured templates for sub-10 nm domains is often limited by their low segregation strength (N). Since

Manipulation of the asymmetric swelling fronts of photoresist polyelectrolyte gradient thin films

September 22, 2008

Author(s)

Vivek M. Prabhu, Ashwin Rao, Shuhui Kang, Eric K. Lin, Sushil K. Satija

The depth profile of swelling polyelectrolyte layers is characterized by a static substrate layer and an asymmetric profile with position and shape parameters

The effect of interfacial roughness on the thin film morphology and charge transport of high performance polythiphenes

September 1, 2008

Author(s)

Yeon-Gil Jung, Regis J. Kline, Daniel A. Fischer, Eric K. Lin, Martin Heeney, Iain McCulloch

A Molecular Model for Toughening in Double-Network Hydrogels

June 18, 2008

Author(s)

Vijay Tirumala, Sanghun Lee, Taiki Tominaga, Eric K. Lin, Jian P. Gong, Paul D. Butler, Wen-Li Wu

A molecular mechanism is proposed for the toughness enhancement observed in double network (DN) hydrogels prepared from poly (2 acrylamido, 2-methyl, 1

The Impact of the Dielectric / Semiconductor Interface on Microstructure and Charge Carrier Transport in High-Performance Polythiophene Transistors

May 14, 2008

Author(s)

Youngsuk Jung, Regis J. Kline, Eric K. Lin, Daniel A. Fischer, Michael F. Toney, Martin Heeney, Iain McCulloch, Dean M. DeLongchamp

The performance of organic field-effect transistors (OFETs) significantly depends on the properties of the interface between the semiconductor and gate

Self-Sealing Nanoporous Low-k Dielectric Patterns Created by Nanoimprint Lithography

April 15, 2008

Author(s)

Hyun Wook Ro, H Peng, Ken-ich Nihara, Hae-Jeong Lee, Eric K. Lin, Alamgir Karim, D Gidley, Hiropshi Jinai, Do Y. Yoon, Christopher L. Soles

In this letter we describe how highly porous nanostructures can be directly printed into a poly(methylsilsequioxane) (PMSQ)-based organosilicate film, with high

Well Ordered Polymer Melts from Blends of Disordered Triblock Copolymer Surfactants and Functional Homopolymers

April 4, 2008

Author(s)

Vijay Tirumala, Alvin Romang, Sumit Agarwal, Eric K. Lin, J J. Watkins

Here, we report that well ordered, processible polymer melts with periodic nanostructures can be obtained in bulk quantity by simple blending of commercially

Characterizing Pattern Structures Using X-Ray Reflectivity

March 28, 2008

Author(s)

Hae-Jeong Lee, Christopher L. Soles, Hyun Wook Ro, Shuhui Kang, Eric K. Lin, Alamgir Karim, Wen-Li Wu

Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic

Nanoimprint Lithography for the Direct Patterning of Nanoporous Interlayer Dielectric Insulator Materials

March 28, 2008

Author(s)

Hyun Wook Ro, Hae-Jeong Lee, Eric K. Lin, Alamgir Karim, Daniel R. Hines, Do Y. Yoon, Christopher L. Soles

Directly patterning dielectric insulator materials for semiconductor devices via nanoimprint lithography has the potential to simplify fabrication processes and

Line Width Roughness and Cross Sectional Measurements of Sub-50 nm Structures with CD-SAXS and CD-SEM

March 24, 2008

Author(s)

Chengqing C. Wang, Ronald L. Jones, Kwang-Woo Choi, Christopher L. Soles, Eric K. Lin, Wen-Li Wu, James S. Clarke, John S. Villarrubia, Benjamin Bunday

Critical dimension small angle x-ray scattering (CD-SAXS) is a measurement platform which is capable of measuring the average cross section and sidewall

The Effect of Interfacial Roughness on the Thin Film Morphology and Charge Transport of High-Performance Polythiophenes

March 11, 2008

Author(s)

Y S. Jung, Regis J. Kline, Daniel A. Fischer, Eric K. Lin, Martin Heeney, Iain McCulloch, Dean M. DeLongchamp

We control and vary the roughness of a dielectric upon which a high-performance polymer semiconductor, poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene)

Structure and Dynamics in Multicomponent Polyelectrolyte Solutions

March 11, 2008

Author(s)

Sanghun Lee, Vijay Tirumala, Michihiro Nagao, Taiki Tominaga, Eric K. Lin, Jian P. Gong, Wen-Li Wu

Double-network hydrogels (DN-gels) prepared from the combination of a moderately crosslinked anionic polyelectrolyte (poly(2-acrylamido-2-methyl-1

Thermodynamic Interactions in Double-Network Hydrogels

March 11, 2008

Author(s)

Taiki Tominaga, Vijay Tirumala, Sanghun Lee, Eric K. Lin, Jian P. Gong, Wen-Li Wu

Double-network hydrogels (DN-gels) prepared from the combination of a moderately crosslinked anionic polyelectrolyte and an uncrosslinked linear polymer

Single cantilever peel test for analysis of adhesion strength in nanotransfer printing

February 17, 2008

Author(s)

Deuk Y. Lee, Gottlieb Oehrlein, Daniel R. Hines, Jiong Liu, Jun Y. Chung, Christopher M. Stafford, Christopher L. Soles, Eric K. Lin

Nanotransfer printing (NTP) has attracted much attention as a method for fabricating nanoscale structures using materials that are not generally compatible with

Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry

February 14, 2008

Author(s)

Kristopher Lavery, Vivek M. Prabhu, Eric K. Lin, Wen-Li Wu, Kwang-Woo Choi, Sushil K. Satija, M Wormington

Off-specular reflectivity, or diffuse scattering, probes the lateral compositional variations at surfaces and interfaces. Of particular interest is the

Lateral Length Scales of Latent Image Roughness as Determined by Off-Specular Neutron Reflectivity

February 14, 2008

Author(s)

Kristopher Lavery, Vivek M. Prabhu, Eric K. Lin, Wen-Li Wu, Sushil K. Satija, Kwang-Woo Choi, M Wormington

A combination of specular and off-specular neutron reflectometry was used to measure the buried lateral roughness of the reaction-diffusion front in a model

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