Surface Directed Crystallization and Autophobic Dewetting in Semicrystalline Polymer Thin Films
D J. Pochan, Eric K. Lin, Wen-Li Wu
Significant crystallization is observed via atomic force microscopy and x-ray diffraction in spin-cast polymer thin films with thickness ranging from 5 microns to 80 nm. Neutron reflectivity also reveals significant crystallinity in the polymer directly neighboring a silicon substrate. Autophobic dewetting occurs upon heating above the polymer bulk melting temperature revealing a persistent polymer/SiOx interfacial layer. The polymer sublayer is stable despite the lack of specific interactions between polymer segments and the silicon substrate.