Pochan, D.
, Lin, E.
and Wu, W.
(2008),
Surface Directed Crystallization and Autophobic Dewetting in Semicrystalline Polymer Thin Films, Physical Review Letters
(Accessed March 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Surface Directed Crystallization and Autophobic Dewetting in Semicrystalline Polymer Thin Films
Published
Author(s)
, ,
Abstract
Significant crystallization is observed via atomic force microscopy and x-ray diffraction in spin-cast polymer thin films with thickness ranging from 5 microns to 80 nm. Neutron reflectivity also reveals significant crystallinity in the polymer directly neighboring a silicon substrate. Autophobic dewetting occurs upon heating above the polymer bulk melting temperature revealing a persistent polymer/SiOx interfacial layer. The polymer sublayer is stable despite the lack of specific interactions between polymer segments and the silicon substrate.Citation
Physical Review Letters
Pub Type
Journals
Keywords
atomic force microscopy, dewetting, polymer crystallization, polymer thin film, polymer/solid interface, x-ray reflectivity, x-ray scattering
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 16, 2008