Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Measuring Structure and Order Development in Organic Semiconductor Films Using Soft X-Ray Spectroscopy

Published

Author(s)

Dean DeLongchamp, S Sambasivan, Daniel A. Fischer, Eric K. Lin, Brandon M. Vogel

Abstract

Paper is abstract.
Citation
Aiche Journal

Keywords

conducting polymer, organic conductor, organic electronics, PEDOT

Citation

DeLongchamp, D. , Sambasivan, S. , Fischer, D. , Lin, E. and Vogel, B. (2008), Measuring Structure and Order Development in Organic Semiconductor Films Using Soft X-Ray Spectroscopy, Aiche Journal (Accessed July 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 16, 2008