U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Uwe Arp (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 25 of 172

Influence of Spectral Bandwidth on the Working Curve in Vat Photopolymerization

April 29, 2024
Author(s)
Benjamin Caplins, Thomas Kolibaba, Uwe Arp, C Cameron Miller, Yuqin Zong, Dianne L. Poster, Callie Higgins, Jason Killgore
In vat photopolymerization, 3-dimensional parts are fabricated by using patterned light to spatially cure a liquid resin. One of the foundational measurements for vat photopolymerization is known as the working curve whereby the depth (i.e. thickness) of

Results of an Interlaboratory Study on the Working Curve in Vat Photopolymerization

March 18, 2024
Author(s)
Thomas Kolibaba, Jason Killgore, Benjamin Caplins, Callie Higgins, Uwe Arp, C Cameron Miller, Yuqin Zong, Dianne L. Poster
The working curve informs resin properties and print parameters for stereolithography, digital light processing, and other photopolymer additive manufacturing (PAM) technologies. First demonstrated in 1992, the working curve measurement of cure depth vs

Characterizing light engine uniformity and its influence on LCD-based vat photopolymerization printing

December 27, 2022
Author(s)
Benjamin Caplins, Callie Higgins, Thomas Kolibaba, Uwe Arp, C Cameron Miller, Dianne L. Poster, Clarence Zarobila, Yuqin Zong, Jason Killgore
Vat photopolymerization (VP) is a rapidly growing category of additive manufacturing. As VP methods mature the expectation is that the quality of printed parts will be highly reproducible. At present, detailed characterization of the light engines used in

Refined Calculations of Synchrotron Radiation for NISTs SURF III Facility

April 16, 2018
Author(s)
Eric L. Shirley, Mitchell L. Furst, Uwe Arp
We have developed a new method for exact calculation of synchrotron radiation for the National Institute of Standards and Technology Synchrotron Ultraviolet Radiation Facility, SURF III. Instead of using the Schwinger formula, which is only an

Broadband Radiometric LED Measurements

September 6, 2016
Author(s)
George P. Eppeldauer, P. Yvonne Barnes, Howard W. Yoon, Leonard Hanssen, Vyacheslav B. Podobedov, Robert E. Vest, Uwe Arp, C Cameron Miller
At present, broadband radiometric measurements of LEDs with uniform and low-uncertainty results are not available. Currently, either spectral radiometric measurements or broadband photometric LED measurements are used. The broadband photometric

Calibration procedure for UV-365 integrated irradiance measurements

September 8, 2015
Author(s)
George P. Eppeldauer, Thomas C. Larason, Robert E. Vest, Uwe Arp, Howard W. Yoon
Since the CIE standardized rectangular-shape spectral response function for the 320 nm to 400 nm wavelength range can be realized only with large spectral mismatch, the realized UV-A meters have different response functions resulting in large errors in

Compact X-ray and Extreme-Ultraviolet Light Sources

July 10, 2015
Author(s)
Lahsen Assoufid, Uwe Arp, Patrick Naulleau, Sandra Biedron , William Graves
Bringing the brightness and power of vast synchrotron and free-electron laser sources to the scale of the lab and clinic marks an important next frontier—and could transform the landscape of X-ray science and technology.

IR-enhanced Si reference detectors for 1-step scale transfers from 300 nm to 1000 nm

November 20, 2014
Author(s)
George P. Eppeldauer, Thomas C. Larason, Jeanne M. Houston, Robert E. Vest, Uwe Arp, Howard W. Yoon
IR-enhanced Si photodiodes have improved radiometric and electronic characteristics as compared to other widely used Si photodiodes and can be used as responsivity standards in the wavelength range from 300 nm to 1000 nm. Their low predicted uncertainty

Absolute pulse energy measurements of soft x-rays at the Linac Coherent Light Source

August 25, 2014
Author(s)
Uwe Arp, Alexander Sorokin, Ulf Jastrow, Pavle Jurani?, Svea Kreis, Mathias Richter, Yiping Feng, Dennis Nordlund, Kai Tiedtke, Philip Heimann, Bob Nagler, Hae Ja Lee, Stephanie Mack, Marco Cammarata, Oleg Krupin, Marc Messerschmidt, Michael Holmes , Michael Rowen, William Schlotter, Stefan Moeller, Joshua Turner
This paper reports novel measurements of x-ray optical radiation on an absolute scale from a recently developed source of radiation generated in the soft x-ray regime of a free electron laser. We give a brief description of the physics behind the

First Report on Quantum Dot Coated CMOS CID Arrays for the UV and VUV

December 13, 2013
Author(s)
Uwe Arp, Robert E. Vest, Zoran Ninkov, Ross Robinson, Suraj Bhaskaran
A technique has been developed for coating commercial off the shelf (COTS) detector arrays with a thin, uniform layer of quantum dots. The quantum deposition is accomplished using an Optomec Aerosol Jet rapid prototyping system. When illuminated by UV

Response of large area avalanche photodiodes to low energy X-rays

April 30, 2012
Author(s)
Thomas R. Gentile, Uwe Arp, M J. Bales, R Farrell
For an experiment to study neutron radiative beta-decay, we operated large area avalanche photodiodes (APDs) at liquid nitrogen temperature to detect X-rays with energies between 0.2 keV and 15 keV. Whereas there are numerous reports of X-ray spectrometry