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Search Publications by: Uwe Arp (Fed)

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Displaying 26 - 50 of 172

Response of large area avalanche photodiodes to low energy X-rays

April 30, 2012
Author(s)
Thomas R. Gentile, Uwe Arp, M J. Bales, R Farrell
For an experiment to study neutron radiative beta-decay, we operated large area avalanche photodiodes (APDs) at liquid nitrogen temperature to detect X-rays with energies between 0.2 keV and 15 keV. Whereas there are numerous reports of X-ray spectrometry

SURF III: A flexible Synchrotron Radiation Source for Radiometry and Research

September 1, 2011
Author(s)
Uwe Arp, Charles W. Clark, Lu Deng, Nadir S. Faradzhev, Alex P. Farrell, Mitchell L. Furst, Steven E. Grantham, Edward W. Hagley, Shannon B. Hill, Thomas B. Lucatorto, Ping-Shine Shaw, Charles S. Tarrio, Robert E. Vest
The calculability of synchrotron radiation (SR) makes electron storage rings wonderful light sources for radiometry. The broadband nature of SR allows coverage of the whole spectral region from the x-ray to the far-infrared. Compact low-energy storage

Synchrotron radiation-based bilateral intercomparison of ultraviolet source calibrations

July 7, 2011
Author(s)
Uwe Arp, Zhigang Li, Ping-Shine Shaw, Mathias Richter, Roman Klein, Wolfgang Paustian, Reiner Thornagel
We report on a successful bilateral inter-comparison between the Physikalisch-Technische Bundesanstalt (PTB) and the National Institute of Standards and Technology (NIST). In both laboratories deuterium lamps were calibrated using the calculability of

Bilateral NIST-PTB Comparison of Spectral Responsivity in the VUV

January 20, 2011
Author(s)
Uwe Arp, Ping-Shine Shaw, Zhigang Li, Alexander Gottwald, Mathias Richter
To compare the calibration capabilities for the spectral responsivity in the vacuum-ultraviolet spectral region between 135 nm and 250 nm, PTB and NIST agreed on a bilateral comparison. Calibrations of semiconductor photodiodes as transfer detectors were

Uniform and enhanced field emission from chromium oxide coated carbon nanosheets

April 2, 2008
Author(s)
Uwe Arp, Kun Hou, Ronald Outlaw, Wang Sigen, Mingyao Zhu, Ronald Quinlan, Dennis Manos, Martin Kordesch, Brian Holloway
Carbon nanosheets, a two-dimensional carbon nanostructure, are promising electron cathode materials for applications in vacuum microelectronic devices. This letter demonstrates a simple approach to improve the spatial emission uniformity of carbon

Ultraviolet Characterization of Integrating Spheres

July 9, 2007
Author(s)
Ping-Shine Shaw, Zhigang Li, Uwe Arp, Keith R. Lykke
We have studied the performance of integrating spheres in the ultraviolet (UV) with wavelengths as short as 200 nm. Two techniques were used for this study; first, the spectral throughput of an integrating sphere irradiated by a deuterium lamp was analyzed

Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III

January 1, 2007
Author(s)
Uwe Arp, Charles E. Gibson, Keith R. Lykke, Albert C. Parr, Robert D. Saunders, D J. Shin, Ping-Shine Shaw, Zhigang Li, Howard W. Yoon
A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the primary