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Characterisation of the Response of Chromium-Doped Alumina Screens in the Vacuum Ultraviolet Using Synchrotron Radiation

Published

Author(s)

James K. McCarthy, A Baciero, B Zurro, Uwe Arp, Charles Tarrio, Thomas B. Lucatorto, A Morono, P Martin, E R. Hodgson

Abstract

We have measured the response of chromium-doped alumina screens to vacuum ultraviolet radiation and derived quantum efficiency curves for the energy range from 30 to 300 eV. A model is presented to explain the structure in this curve. In addition, the radiation hardness of such screens, which have application as a narrow-band radiation detectors for a hot fusion plasma diagnostic, is reported here for MeV electrons. Finally, a simple model constructed to obtain the carrier diffusion length and the bulk efficiency of this material.
Citation
Journal of Applied Physics
Volume
92
Issue
No. 11

Keywords

quantum efficiency, radiation hardness, synchrotron radiation

Citation

McCarthy, J. , Baciero, A. , Zurro, B. , Arp, U. , Tarrio, C. , Lucatorto, T. , Morono, A. , Martin, P. and Hodgson, E. (2002), Characterisation of the Response of Chromium-Doped Alumina Screens in the Vacuum Ultraviolet Using Synchrotron Radiation, Journal of Applied Physics (Accessed April 12, 2024)
Created November 30, 2002, Updated October 12, 2021