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Search Publications by: William E. Wallace (Fed)

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Displaying 76 - 100 of 110

Convalent Cationization Method for the Analysis of Polyethylene by Mass Spectrometry

December 1, 2001
Author(s)
Barry J. Bauer, William E. Wallace, B M. Fanconi, Kathleen M. Flynn
Polyethylene and other polyolefins have not been amenable to mass spectrometric characterization of molecular mass distribution due to the ineffectiveness of conventional methods of cationization. The lack of polar groups, unsaturation, and aromaticity

Prediction of Lateral and Normal Force-Displacement Curves for Flipchip Solder Joints

September 1, 2001
Author(s)
Daniel Wheeler, Daniel Josell, James A. Warren, William E. Wallace
We present the results of experiments and modeling of flip-chip geometry solder joint shapes under shear loading. Modeling, using Surface Evolver, included development of techniques that use an applied vector force (normal and shear loading) as input to

Polymer Chain Relaxation: Surface Outpaces Bulk

July 1, 2001
Author(s)
William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer
In this work we show how carbon near-edge X-ray absorption fine structure (NEXAFS) can be applied to detect both surface and bulk segmental relaxation in uniaxially deformed polystyrene samples. We demonstrate that by simultaneously monitoring the partial

MALDI MS of Saturated Hydrocarbon Polymers: Polyethylene and Other Polyolefins

May 1, 2001
Author(s)
William E. Wallace, Charles M. Guttman, B M. Fanconi, Barry J. Bauer
Saturated hydrocarbon polymers, polyethylene and polypropylene, are, by production volume, the most widely used of all synthetic polymers. Their molecular mass and molecular mass distribution (MMD) are critical in determining performance properties. There

Absolute Molecular Orientational Distribution of the Polystyrene Surface

April 1, 2001
Author(s)
Kimberly A. Briggman, John C. Stephenson, William E. Wallace, Lee J. Richter
Vibrationally-resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characterization of

Mass Spectrometry of Spin-On-Glass Low-K Dielectric Precursors

April 1, 2001
Author(s)
William E. Wallace, Kathleen M. Flynn, Joseph M. Antonucci
The degree-of-intramolecular-condensation, defined as the number of residual silanol (SiOH) groups per oligomer, for a variety of silsesquioxane polymers was measured by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry. Reaction

NIST-Sponsored Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry: Statistical Analysis

March 1, 2001
Author(s)
Charles M. Guttman, S Wetzel, William R. Blair, B M. Fanconi, Kathleen M. Flynn, R J. Goldschmidt, William E. Wallace, David L. VanderHart
Matrix-assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS) is becoming a new and important technique in synthetic polymer characterization. Yet much is still unknown about the molecular mass distribution (MWD) which is

Abstracts for the MSEL Assessment Panel, March 2001

January 26, 2001
Author(s)
Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.

Determination of the Molecular Mass Distribution of Narrow Polydispersity Polystyrene by MALDI-TOF-MS: Interlaboratory Comparison

March 1, 2000
Author(s)
Kathleen M. Flynn, S Wetzel, William E. Wallace, William R. Blair, R J. Goldschmidt, David L. VanderHart, B M. Fanconi
NIST has sponsored a matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) interlaboratory comparison using a well-characterized polystyrene to determine the reproducibility in determining the molecular mass

MALDI-TOF Mass Spectrometry of Polymeric Silsesquioxanes

March 1, 2000
Author(s)
William E. Wallace, Charles M. Guttman, Joseph M. Antonucci
Matrix-assisted laser desorption ionization time-of-flight mass spectrometry has been shown to be an effective method to determine the degree-of-intramolecular-condensation of polymeric silsesquioxanes. The nature of the organic R' leaving group was found