Fuoco, E.
, Gillen, G.
, Wijesundara, M.
, Wallace, W.
and Hanley, L.
(2001),
Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles, Journal of Physical Chemistry B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853757
(Accessed October 5, 2024)
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Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles
Published
Author(s)
E Fuoco, G Gillen, M B. Wijesundara, , L Hanley
Citation
Journal of Physical Chemistry B
Volume
105(18)
Pub Type
Journals
Download Paper
Keywords
Scattering, Spectroscopy, cluster bombardment, polyatomic ion bombardment, secondary ion mass spectrometry, sputter yield
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 2000, Updated October 12, 2021