Fuoco, E.
, Gillen, G.
, Wijesundara, M.
, Wallace, W.
and Hanley, L.
(2001),
Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles, Journal of Physical Chemistry B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853757
(Accessed April 26, 2024)
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Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles
Published
Author(s)
E Fuoco, G Gillen, M B. Wijesundara, , L Hanley
Citation
Journal of Physical Chemistry B
Volume
105(18)
Pub Type
Journals
Download Paper
Keywords
Scattering, Spectroscopy, cluster bombardment, polyatomic ion bombardment, secondary ion mass spectrometry, sputter yield
Citation
Created December 31, 2000, Updated October 12, 2021