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Search Publications by: Thomas A. Germer (Fed)

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Displaying 151 - 175 of 197

Angular Distribution of Light Scattered From a Sinusoidal Grating

January 1, 2000
Author(s)
Egon Marx, Thomas A. Germer, Theodore V. Vorburger, B C. Park
The angular distributions of light scattered by gold-coated and aluminum-coated gratings having amplitudes of ~90 nm and periods of 6.67 ¿m were measured and calculated for light incident from a HeNe laser at an angle of 6E. Experimental results are

Characterization of Materials Using an Ultraviolet Radiometric Beamline at SURF III

January 1, 2000
Author(s)
Ping-Shine Shaw, R Gupta, Thomas A. Germer, Uwe Arp, Thomas B. Lucatorto, Keith R. Lykke
The completion of the upgrade of the synchrotron facilities at the National Institute of Standards and Technology (NIST) has yielded a better-characterization broadband source of ultraviolet (UV) radiation at the Synchrotron Ultraviolet Radiation Facility

Optical Properties of Materials: A Sampling of NIST Contributions

January 1, 2000
Author(s)
Thomas A. Germer, R Gupta, Leonard M. Hanssen, Eric L. Shirley
Optics has found an extremely wide range of applications in industry and science, and the properties of the materials that make up optical instruments are key to their performance. Examples include glass for optical instrumentation such as telescopes and

Multidetector Hemispherical Polarized Optical Scattering Instrument

July 1, 1999
Author(s)
Thomas A. Germer
A multidetector optical scattering instrument is described and characterized. The instrument has twenty-eight detectors surrounding and substantially covering the scattering hemisphere. Each detector contains a polarizer so that each is only sensitive to p

Polarization of Light Scattered by Particles on Silicon Wafers

January 1, 1999
Author(s)
Li Piin Sung, George W. Mulholland, Thomas Germer
Bidirectional ellipsometry has been developed as a technique for distinguishing among various scattering features near surfaces.Employi Employing incident light with fixed polarization, the technique measures the principal angle of polarization and the
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