Germer, T.
(2000),
Measurement of Roughness of Two Interfaces of a Dielectric Film by Scattering Ellipsometry, Physical Review Letters
(Accessed May 19, 2025)
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Measurement of Roughness of Two Interfaces of a Dielectric Film by Scattering Ellipsometry
Published
Author(s)
Citation
Physical Review Letters
Volume
85
Issue
2
Pub Type
Journals
Citation
Issues
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Created January 1, 2000, Updated February 17, 2017