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Search Publications by: Theodore V. Vorburger (Assoc)

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Displaying 351 - 375 of 417

Stylus Flight in Surface Profiling

January 1, 1996
Author(s)
Jun-Feng Song, Theodore V. Vorburger
In this paper, theoretical and experimental work on stylus flight is described. Experiments on the surfaces of different roughness specimens with sinusoidal, rectangular, triangular and random waveforms support the theoretical model, which predicts stylus

Uncertainty Procedure for NIST Surface Finish and Microform Calibration

January 1, 1996
Author(s)
Jun-Feng Song, Theodore V. Vorburger
An uncertainty procedure is used for reporting the NIST surface finish and microform calibration uncertainties. The combined standard uncertainty is a combination of the uncertainty from the geometric non-uniformity of the measured surface, and the

Stylus Technique for Direct Verification of Rockwell Diamond Indenters

November 23, 1995
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, J Smith
Based on a stylus technique, a microform calibration system was developed at NIST for the direct verification of Rockwell diamond indenters. The least-squares radius and profile deviations, cone angle and cone flank straightness, and the holder axis

Microform Calibration Uncertainties of Rockwell Diamond Indenters

September 1, 1995
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, J Smith
National and international comparisons in Rockwell hardness tests show significant differences. Uncertainties in the geometry of the Rockwell diamond indenters are largely responsible for these differences. By using a stylus instrument, with a series of

Microform Calibrations in Surface Metrology

February 1, 1995
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the profile

A Metrology Approach to Unifying Rockwell C Hardness Scales

January 1, 1995
Author(s)
Jun-Feng Song, J Smith, Theodore V. Vorburger
Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of standard hardness machines and diamond indenters, the unified hardness scale may exhibit a

Working and Check Standards for NIST Surface and Microform Measurements

January 1, 1995
Author(s)
Jun-Feng Song, Theodore V. Vorburger
Different working standards and check standards are used in the NIST surface and microform measurement laboratory for calibrating instruments, establishing measurement traceability and control measurement uncertainty. The basic requirements for these

An Instrument for Calibrating Atomic Force Microscope Standards

May 1, 1994
Author(s)
J Schneir, T Mcwaid, Theodore V. Vorburger
To facilitate the use of AFMs for manufacturing we have initiated a project to develop and calibrate artifacts which can in turn be used to calibrate a commercial AFM so that subsequent AFM measurement are accurate and traceable back to the wavelength of

The Measurement and Uncertainty of a Calibration Standard for the SEM

March 1, 1994
Author(s)
Joseph Fu, M Croarkin, Theodore V. Vorburger
Standard Reference Material 484 is an artifact for calibration the magnification scale of a Scanning Electron Microscope (SEM) within the range of 1000X to 20000X. Seven issues, SRM-484, and SRM-484a to SRM-484f, have been certified between 1977 and 1992
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