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Search Publications by: Theodore V. Vorburger (Assoc)

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Displaying 376 - 400 of 417

Methods Divergence Between Measurements of Micrometer and Sub-Micrometer Surface Features

January 1, 1994
Author(s)
T Mcwaid, Theodore V. Vorburger, Joseph Fu, Jun-Feng Song, Eric P. Whitenton
Measurements of micrometer and sub-micrometer surface features have been made using a stylus profiler, an STM, an AFM, and a phase-measuring interferometric microscope. The differences between measurements of the same surface feature as obtained with the

Microform Calibrations in Surface Metrology

January 1, 1994
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the profile

Strategy for Post-Process Control of a Machine Tool

January 1, 1994
Author(s)
Theodore V. Vorburger, K Yee, Brian R. Scace, F Rudder
The automated control of machine-tool accuracy is discussed based on a quality architecture containing three control loops: real-time, process-intermittent, and post-process. This paper highlights the post-process loop. The architecture is being

The Geometric Characterization of Rockwell Diamond Indenters

January 1, 1994
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell diamond indenters with a traceability to fundamental measurements. The combined measurement

Regimes of Surface Roughness Measurable with Light Scattering

January 1, 1993
Author(s)
Theodore V. Vorburger, Egon Marx, T Lettieri
In this paper we summarize a number of previous experiments on the measurement of the roughness of metallic surfaces by light scattering. We identify several regimes that permit measurement of different surface parameters and functions, and we establish

Implementation of the Surface Roughness Instrument (SRI) Controller

January 1, 1988
Author(s)
Howard T. Moncarz, Theodore V. Vorburger
This document describes the implementation specifics of the surface roughness instrument (SRI) controller program. The SRI is part of the inspection workstation (IWS) in the Automated Manufacturing Research Facility (AMRF) in the Center for Manufacturing
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