Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A Calibrated Atomic Force Microscope

Published

Author(s)

T Mcwaid, J Schneir, Theodore V. Vorburger

Abstract

Abstract not available.
Proceedings Title
Proceedings of the 3rd International Conference on Ultraprecision in Manufacturing Engineering
Conference Dates
May 1, 1994
Conference Location
Aachen, DE

Citation

Mcwaid, T. , Schneir, J. and Vorburger, T. (1994), A Calibrated Atomic Force Microscope, Proceedings of the 3rd International Conference on Ultraprecision in Manufacturing Engineering, Aachen, DE (Accessed June 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1993, Updated October 12, 2021