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Search Publications by: Cedric J Powell (Assoc)

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Displaying 201 - 225 of 378

Detection of Pinholes in Ultrathin Films by Magnetic Coupling

January 1, 2001
Author(s)
William F. Egelhoff Jr., L Gan, P J. Chen, Cedric J. Powell, Robert McMichael, R A. Fry
When two magnetic films are separated by a nonmagnetic film, pinholes in the nonmagnetic film can allow direct contact and, thereby, magnetic coupling between the two magnetic films. We have studied this coupling by having one of the magnetic films pinned

Surface and interface effects in the growth of giant magnetoresistance spin valves for ultrahigh-density data-storage applications

January 1, 2001
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, Robert McMichael, Mark D. Stiles
The current generation of hard disk drives use Giant Magnetoresistance (GMR) spin valves as the read-head because the GMR effect is currently the most sensitive way to detect magnetic fields at submicron length scales and data rates of approximately equal}

Impact of XPS on Practical Industrial Problems and Needs for the Future

November 1, 2000
Author(s)
Cedric J. Powell
A summary is given of a panel discussion on the impact of x-ray photoelectron spectroscopy on practical industrial problems and needs for the future. This summary will be included in a report of the Workshop on X-Ray Photoelectron Spectroscopy: From

NIST Data Resources for X-Ray Photoelectron Spectroscopy

October 1, 2000
Author(s)
Cedric J. Powell
A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic

Experimental Determination of Electron Effective Attenuation Lengths in Silicon Dioxide Thin Films Using Synchrotron Radiation - I. Data Analysis and Comparisons

May 1, 2000
Author(s)
M Suzuki, H Ando, Yukihiru Higashi, H Takenaka, H Shimada, N Matsubayashi, M Imamura, S Kurosawa, S Tanuma, Cedric J. Powell
We have measured effective attenuation lengths (EALs) of 140 to 1100 eV electrons in ultrathin silicon dioxide layers using synchrotron radiation. These EALs were generally smaller than those reported previously although there was agreement with the values

Experimental Determination of Electron Effective Attenuation Lengths in Silicon Dioxide Thin Films Using Synchrotron Radiation - II. Effects of Elastic Scattering

May 1, 2000
Author(s)
Y Shimada, N Matsubayashi, M Imamura, M Suzuki, Yukihiru Higashi, H Ando, H Takenaka, S Kurosawa, S Tanuma, Cedric J. Powell
The effective attenuation lengths (EALs) of photoelectrons in thin silicon dioxide films on a Si(100) substrate were measured as a function of electron energy using synchrotron radiation as an energy-tunable excitation source. The ratios of EALs to

Hot-Electron Attenuation Lengths in Ultrathin Magnetic Films

May 1, 2000
Author(s)
R P. Lu, B A. Morgan, K L. Kavanagh, Cedric J. Powell, P J. Chen, F Serpa, W F. Egelhoff
Ballistic electron emission microscopy (BEEM) is used to measure hot electron transport across magnetic metal multilayers. Room temperature measurements in air have been carried out on Au/M/Si(100), Au/M/Au/Si(100) and Au/M/PtSi/Si diodes, that were

Interfacial Scattering of Hot Electrons in Ultrathin Au/Co Films

January 1, 2000
Author(s)
R P. Lu, B A. Morgan, K L. Kavanagh, Cedric J. Powell, P J. Chen, F Serpa, William F. Egelhoff Jr.
We have used room temperature, ballistic electron emission microscopy (BEEM) to measure hot-electron transport through ultra-thin Au/Co multilayre structures deposited onto Si. The samples consist of Au/Co/Si or (Au/Co) n/AuSi diodes, sputter deposited at
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