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Search Publications by: Cedric J Powell (Assoc)

Displaying 226 - 250 of 378

Interfacial Scattering of Hot Electrons in Ultrathin Au/Co Films

January 1, 2000

Author(s)

R P. Lu, B A. Morgan, K L. Kavanagh, Cedric J. Powell, P J. Chen, F Serpa, William F. Egelhoff Jr.

We have used room temperature, ballistic electron emission microscopy (BEEM) to measure hot-electron transport through ultra-thin Au/Co multilayre structures deposited onto Si. The samples consist of Au/Co/Si or (Au/Co) n/AuSi diodes, sputter deposited at

NIST Electron Inelastic-Mean-Free-Path Database 71, Version 1.0

December 1, 1999

Author(s)

Cedric J. Powell, Aleksander Jablonski

Surface Effects in the Growth of Magnetic Multilayers Which Exhibit the Giant Magnetoresistance Effect

December 1, 1999

Author(s)

W. Egelhoff, P J. Chen, Cedric J. Powell, D Parks, Robert McMichael, J H. Judy, D Martien, A E. Berkowitz, J. M. Daughton

Surface Sensitivity of Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

August 9, 1999

Author(s)

Cedric J. Powell, E Jablonski, I Tilinin, David R. Penn

A convenient measure of surface sensitivity in Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) is the mean escape depth (MED). If the effects of elastic-electron scattering are neglected, the MED is equal to the electron

Specular Electron Scattering in Metallic Thin Films

May 1, 1999

Author(s)

William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, D Parks, F Serpa, Robert McMichael, D Martien, A. E. Berkowitz

Specular electron scattering at the surface of metallic thin films is an important phenomenon for a class of magnetic multilayers known as giant magnetoresistance (GMR) spin valves. In the very best GMR spin valves, a significant part of the GMR effect is

Relationships Between Electron Inelastic Mean Free Paths, Effective Attenuation Lengths, and Mean Escape Depths

March 1, 1999

Author(s)

Aleksander Jablonski, Cedric J. Powell

The terms inelastic mean free path (IMFP), effective attenuation length (EAL), and mean escape depth (MED) are frequently used to specify the surface sensitivity of Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS). These terms

Summary of ISO/TC 201 Standards: Introduction

March 1, 1999

Author(s)

Cedric J. Powell, R Shimizu

An introduction is given to a planned series of short summaries of international standards developed by Technical Committee 201 on Surface ChemicalAnalysis of the International Organization for Standardization (ISO). The purpose of these summaries is to

Chris Ernie Earl Kuyatt - Obituary

January 1, 1999

Author(s)

Robert Celotta, John William Gadzuk, Cedric J. Powell

Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces

January 1, 1999

Author(s)

Cedric J. Powell, Aleksander Jablonski

An analysis is given of the consistency of calculated and measured electron inelastic mean free paths (IMFPs) near solid surfaces for electron energies between 50 eV and 10 4 eV, the energy range of relevance for surface analysis by Auger-electron

Surface Sensitivity of Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

January 1, 1999

Author(s)

Cedric J. Powell, Aleksander Jablonski, I S. Tilinin, S Tanuma, David R. Penn

Beam Effects, Surface Topography, and Depth Profiling in Surface and Near-Surface Analysis

December 1, 1998

Author(s)

A W. Czanderna, T E. Madey, Cedric J. Powell

Consistency of Calculated and Measured Electron Inelastic Mean Free Paths

December 1, 1998

Author(s)

Cedric J. Powell, Aleksander Jablonski

We present an evaluation of the consistency of calculated and measured electron inelastic mean free paths (IMFPs) for seven elemental solids (Al, Si, Ni, Cu, Ge, Ag, and Au). These solids were selected because, for each, there were two or more independent

Importance of VAMAS and ISO in Developing Reference Standards and Documentary Standards for Practical Surface Analysis

December 1, 1998

Author(s)

Cedric J. Powell, R Shimizu

An overview is given of the development of reference standards by the Surface Chemical Analysis group of the Versailles Project on Advanced Materials and Standards (VAMAS) and of the development of documentary standards by Technical Committee 201 on

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