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Search Publications by: Joseph J. Kopanski (Assoc)

Displaying 226 - 250 of 256

Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites

April 1, 1994

Author(s)

David G. Seiler, J R. Lowney, W. R. Thurber, Joseph Kopanski, George G. Harman

Boron-Implanted 6H-SiC Diodes

August 1, 1993

Author(s)

M Ghezzo, D. M. Brown, E. Downey, J K. Kretchmer, Joseph Kopanski

Review of Semiconductor Microelectronic Test Structures with Applications to Infrared Detector Materials and Processes

July 1, 1993

Author(s)

Joseph Kopanski, C. E. Schuster

Charge Trapping in Cubic Silicon Carbide MIS Capacitors

December 31, 1992

Author(s)

Joseph J. Kopanski

High Spatial Resolution Mapping of Resistivity Variations in Semiconductors

December 31, 1992

Author(s)

Joseph Kopanski, G. P. Carver, J R. Lowney, D. S. Miles, Donald B. Novotny

High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride

August 1, 1992

Author(s)

Joseph Kopanski, J R. Lowney, Donald B. Novotny, David G. Seiler, A. Simmons, J. Ramsey

Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits

December 31, 1991

Author(s)

Joseph Kopanski, David L. Blackburn, George G. Harman, David W. Berning

High Spatial Resolution Mapping of Semiconductor Resistivity

December 31, 1991

Author(s)

Joseph Kopanski, J R. Lowney, D. S. Miles, Donald B. Novotny, G. P. Carver

High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride

December 31, 1991

Author(s)

Joseph Kopanski, J R. Lowney, Donald B. Novotny, David G. Seiler, A. Simmons, J. Ramsey

Permittivity Measurements on Molecular-Sized Samples, Extended Abstract

December 1, 1990

Author(s)

A. van Roggen, L. Yuwono, Hui Zhou, Paul H. Meijer, Joseph Kopanski

Verification of the Relation Between Two-Probe and Four-Probe Resistances as Measured on Silicon Wafers

December 1, 1990

Author(s)

Joseph Kopanski, John Albers, G. P. Carver, James R. Ehrstein

MIS Capacitor Studies on Silicon Carbide Single Crystals: Final Report for May 8, 1989 to November 8, 1989

July 1, 1990

Author(s)

Joseph J. Kopanski

Electrical Characterization of Beta Silicon Carbide MIS Capacitors with Thermally Grown or Chemical-Vapor-Deposited Oxides

December 31, 1989

Author(s)

Joseph Kopanski, Donald B. Novotny