Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites

Published

Author(s)

David G. Seiler, J R. Lowney, W. R. Thurber, Joseph Kopanski, George G. Harman
Citation
Special Publication (NIST SP) -

Citation

Seiler, D. , Lowney, J. , Thurber, W. , Kopanski, J. and Harman, G. (1994), Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13439 (Accessed April 16, 2024)
Created March 31, 1994, Updated October 12, 2021