@misc{763971,
  author = {David Seiler and J Lowney and W. Thurber and Joseph Kopanski and George Harman},
  title = {Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites},
  year = {1994},
  month = {1994-04-01 00:04:00},
  publisher = {Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13439},
  language = {en},
}