TY - GEN AU - David Seiler AU - J Lowney AU - W. Thurber AU - Joseph Kopanski AU - George Harman C2 - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD DA - 1994-04-01 00:04:00 LA - en PB - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD PY - 1994 TI - Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13439 ER -