Kopanski, J.
(1990),
MIS Capacitor Studies on Silicon Carbide Single Crystals: Final Report for May 8, 1989 to November 8, 1989, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed July 27, 2024)
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MIS Capacitor Studies on Silicon Carbide Single Crystals: Final Report for May 8, 1989 to November 8, 1989
Published
Author(s)
Citation
NIST Interagency/Internal Report (NISTIR) -
Volume
4352
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 1, 1990, Updated February 17, 2017