van Roggen, A.
, Yuwono, L.
, Zhou, H.
, Meijer, P.
and Kopanski, J.
(1990),
Permittivity Measurements on Molecular-Sized Samples, Extended Abstract, Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Pocono Manor, PA, USA
(Accessed October 15, 2024)