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Permittivity Measurements on Molecular-Sized Samples, Extended Abstract

Published

Author(s)

A. van Roggen, L. Yuwono, Hui Zhou, Paul H. Meijer, Joseph Kopanski
Proceedings Title
Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP)
Conference Dates
October 29-November 1, 1990
Conference Location
Pocono Manor, PA, USA

Citation

van Roggen, A. , Yuwono, L. , Zhou, H. , Meijer, P. and Kopanski, J. (1990), Permittivity Measurements on Molecular-Sized Samples, Extended Abstract, Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Pocono Manor, PA, USA (Accessed February 25, 2024)
Created November 30, 1990, Updated October 12, 2021