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Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits

Published

Author(s)

Joseph Kopanski, David L. Blackburn, George G. Harman, David W. Berning
Proceedings Title
Proc., First International High Temperature Electronics Conference
Conference Dates
June 16-20, 1991
Conference Location
Albuquerque, NM, USA

Citation

Kopanski, J. , Blackburn, D. , Harman, G. and Berning, D. (1991), Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits, Proc., First International High Temperature Electronics Conference, Albuquerque, NM, USA (Accessed July 23, 2024)

Issues

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Created December 30, 1991, Updated October 12, 2021