Kopanski, J.
, Blackburn, D.
, Harman, G.
and Berning, D.
(1991),
Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits, Proc., First International High Temperature Electronics Conference, Albuquerque, NM, USA
(Accessed April 19, 2024)
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Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits
Published
Author(s)
, , ,
Proceedings Title
Proc., First International High Temperature Electronics Conference
Conference Dates
June 16-20, 1991
Conference Location
Albuquerque, NM, USA
Pub Type
Conferences
Citation
Created December 30, 1991, Updated October 12, 2021