TY  - CONF
AU  - Joseph Kopanski
AU  - David Blackburn
AU  - George Harman
AU  - David Berning
C2  - Proc., First International High Temperature Electronics Conference, Albuquerque, NM, USA
DA  - 1991-12-31 00:12:00
LA  - en
PB  - Proc., First International High Temperature Electronics Conference, Albuquerque, NM, USA
PY  - 1991
TI  - Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits
ER  -