TY  - CONF
AU  - Kopanski, Joseph
AU  - Blackburn, David
AU  - Harman, George
AU  - Berning, David
C2  - Proc., First International High Temperature Electronics Conference, Albuquerque, NM, USA
DA  - 1991-12-31 00:12:00
LA  - en
PB  - Proc., First International High Temperature Electronics Conference, Albuquerque, NM, USA
PY  - 1991
TI  - Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits
ER  -