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Publications

Search Publications by

Terrence J. Jach (Fed)

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Displaying 1 - 25 of 35

Controllable Catastrophe X-Ray Focusing

October 12, 2021
Author(s)
S M. Durbin, Terrence J. Jach, S. Kim, J. A. Aust
The interaction of waves with inhomogeneous media leads to the natural focusing of light, the channelling of waves into stable caustics such as the pattern of sunlight seen at the bottom of a rippled swimming pool. These effects are also found in surface

Resonant X-ray Emission and Valence-band Lifetime Broadening in LiNO3

August 28, 2019
Author(s)
John T. Vinson, Terrence J. Jach, Matthias Mueller, Rainer Unterumsberger, Burkhard Beckhoff
X-ray absorption and resonant inelastic x-ray scattering measurements are carried out on lithium nitrate LiNO3. Echoing previous studies on ammonium nitrate, the σ orbitals around the nitrogen atoms exhibit a large lifetime effect. Experimentally, this is

Intrinsic Orbital Angular Momentum States of Neutrons

March 2, 2018
Author(s)
Ronald L. Cappelletti, Terrence J Jach, John T. Vinson
A recent neutron interferometry experiment attempted to observe the orbital angular momentum (OAM) of neutron de Broglie waves of neutron de Broglie waves using a spiral phase (SPP) (Nature 525, 504 (2015) [1]). Based upon conventional neutron optical

Resonant X-ray Emission of Hexagonal Boron Nitride

November 9, 2017
Author(s)
John T. Vinson, Terrence J Jach, Matthias Mueller, Rainer Unterumsberger, Burkhard Beckhoff
The electronic structure of hexagonal boron nitride ({\it h}-BN) is explored using measurements of x-ray absorption and resonant inelastic x-ray scattering (RIXS) at the nitrogen K edge (1{\it s}) in tandem with calculations of the same using many-body

Quasiparticle Lifetime Broadening in Resonant X-ray Scattering of Ammonium Nitrate

July 29, 2016
Author(s)
John T. Vinson, Terrence J. Jach, Matthias Mueller, Rainer Unterrumsberger, Burkhard Beckhoff
It has been previously shown that two effects cause dramatic changes in the x-ray absorption and emission spectrra from the N K edge of the insulating crystal ammonium nitate. First, vibrational disorder causes major changes in the absorption spectrum

The Multiple Origins of Broadening in Near-edge X-ray Spectra of Nitrogen Compounds

November 10, 2014
Author(s)
John T. Vinson, Terrence J Jach, W. T. Elam, J. D. Denlinger
A comparison of the N Kα emission spectrum of crystalline ammonium nitrate to molecular orbital calculations reveals a unique observation: the peak associated with the σNO recombination is broadened so extensively as to virtually disappear. We have

Multiplexed microcalorimeter arrays for precision measurements from microwave to gamma-ray wavelengths

August 21, 2007
Author(s)
Joel Ullom, W.Bertrand (Randy) Doriese, James A. Beall, William Duncan, S. L. Ferreira, Gene C. Hilton, Rob Horansky, Kent D. Irwin, Terrence J. Jach, John Mates, Nathan A. Tomlin, Galen O'Neil, Carl D. Reintsema, Nicholas Ritchie, Dan Schmidt, Leila R. Vale, Yizi Xu, Barry L. Zink, Andrew Hoover, Clifford R. Rudy, Derek Tournear, Duc Vo, Michael W. Rabin
Cryogenic microcalorimeters are a promising technology for ultrasensitive measurements of electromagnetic radiation from microwave to gamma-ray wavelengths. Cryogenic microcalorimeters derive their exquisite sensitivity from the minimal thermal noise at

Variable Magnification With Kirkpatrick-Baez Optics for Synchrotron X-Ray Microscopy

May 1, 2006
Author(s)
Terrence J. Jach, A S. Bakulin, S M. Durbin, J Pedulla, A T. Macrander
We describe the distinction between the operation of a short focal lengthx-ray microscope forming a real image with a laboratory source (convergentillumination) and with a highly collimated intense beam from a synchrotronlight source (K\{o}hler

Comparative Thickness Measurements of SiO 2 /Si Films for Thickness Less than 10 nm

January 1, 2004
Author(s)
Terrence J. Jach, Joseph A. Dura, Nhan V. Nguyen, J R. Swider, G Cappello, Curt A. Richter
We report on a comparative measurement of SiO2/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to 6 nm were

Real-Time Studies of Strains at Ferroelectric Domain Walls under an Applied Field

August 17, 2002
Author(s)
Terrence J. Jach, S. Kim, S M. Durbin, J. A. Aust, David S. Bright
We report on an improved method of visualizing domains in congruent ferroelectric crystals such as LiNbO^d3 with Bragg x-ray topography. Using monochromatic synchrotron undulator radiation and a magnifying x-ray camera, we are able to image domains created

Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics

December 1, 2001
Author(s)
Terrence J. Jach, S M. Durbin, A S. Bakulin, David S. Bright, C B. Stagarescu, G Srajer, D. Haskel, J Pedulla
Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB field-imaging microscope which operates in the x-ray energy range 6-10 keV with a field of view of

Bulk and Surface Evidence for the Long Range Spatial Modulation of X-Ray Absorption in the AlPdMn Quasicrystal at Bragg Incidence

January 1, 2001
Author(s)
G Cappello, A Dechelette, F Schmithusen, S Decossas, J Chevrier, F Comin, V Formoso, M. De Boissieu, Terrence J. Jach, R. Colella, T Lograsso, C Jenks, D W. Delaney
An X-ray standing waves experiment was performed at the ID32 beam line of the ESRF on an Al-PD-Mn quasicrystal with the X-ray beam at normal incidence. The X-ray photoemission core levels for each element were recorded to probe the surface. The drain

Quasicrystal Element Correlations From X-Ray Standing Waves

January 1, 2001
Author(s)
Terrence J. Jach
X-ray standing waves associated with dynamical diffraction in perfect crystals are also present during diffraction in high-quality quasicrystals. The fluorescence observed from quasicrystals while scanning the rocking curve of a particular Bragg reflection

Fast Imaging of Hard X-Rays With a Laboratory Microscope

July 1, 2000
Author(s)
A S. Bakulin, S M. Durbin, Terrence J. Jach, J Pedulla
An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x-rays. It uses the Kirkpatrick-Baez multilayer mirror design to form