Resonant X-ray Emission of Hexagonal Boron Nitride

Published: November 09, 2017


John T. Vinson, Terrence J. Jach, Matthias Mueller, Rainer Unterumsberger, Burkhard Beckhoff


The electronic structure of hexagonal boron nitride ({\it h}-BN) is explored using measurements of x-ray absorption and resonant inelastic x-ray scattering (RIXS) at the nitrogen K edge (1{\it s}) in tandem with calculations of the same using many-body perturbation theory within the {\it GW} and Bethe-Salpeter equation (BSE) approximations. Our calculations include the effects of lattice disorder from phonons activated thermally and from zero point energy and highlight the influence of disorder on near-edge x-ray spectra.
Citation: Physical Review B
Volume: 96
Pub Type: Journals
Created November 09, 2017, Updated November 09, 2017