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Resonant X-ray Emission of Hexagonal Boron Nitride
Published
Author(s)
John T. Vinson, Terrence J Jach, Matthias Mueller, Rainer Unterumsberger, Burkhard Beckhoff
Abstract
The electronic structure of hexagonal boron nitride ({\it h}-BN) is explored using measurements of x-ray absorption and resonant inelastic x-ray scattering (RIXS) at the nitrogen K edge (1{\it s}) in tandem with calculations of the same using many-body perturbation theory within the {\it GW} and Bethe-Salpeter equation (BSE) approximations. Our calculations include the effects of lattice disorder from phonons activated thermally and from zero point energy and highlight the influence of disorder on near-edge x-ray spectra.
Vinson, J.
, , T.
, Mueller, M.
, Unterumsberger, R.
and Beckhoff, B.
(2017),
Resonant X-ray Emission of Hexagonal Boron Nitride, Physical Review B, [online], https://doi.org/10.1103/PhysRevB.96.205116
(Accessed October 14, 2025)