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Search Publications

NIST Authors in Bold

Displaying 101 - 125 of 1560

Remote Bias Induced Electrostatic Force Microscopy for Subsurface Imaging

March 5, 2018
Author(s)
Joseph J. Kopanski, Lin You, Yaw S. Obeng
Contrast in electrostatic force microscopy (EFM) depends on the electrostatic force between the tip and sample. In the related technique, scanning Kelvin force microscopy (SKFM), contrast arises from the force due to the capacitance gradient with tip-to

Measurement of Radio-Frequency Radiation Pressure

February 13, 2018
Author(s)
Christopher L. Holloway, Alexandra B. Artusio-Glimpse, Matthew T. Simons, Ivan Ryger
In this work we perform measurements of the radiation pressure of a radio-frequency (RF) electromagnetic field which will lead to a new SI traceable power calibration. There are several groups around the world investigating methods to perform more direct

Identifying spurious modes in RF-MEMS resonators using photoelastic imaging

January 21, 2018
Author(s)
Vikrant J. Gokhale, Jason J. Gorman
This paper reports the first use of dynamic photoelastic imaging for identifying in-plane vibration modes in high-frequency MEMS resonators. In a set of width-extensional mode resonators (WE-BARs), we map fundamental width-extensional modes and unwanted

How to extract distributed circuit parameters from the scattering parameters of a transmission line

January 15, 2018
Author(s)
Nathan D. Orloff, Jasper A. Drisko, Angela C. Stelson, Charles A. Little, James C. Booth, Jordi Mateu, Christian J. Long
Distributed circuit parameters parameterize the transmission and reflection off a given transmission line in terms of a distributed resistance, inductance, capacitance, and conductance, which are per unit length frequency dependent quantities. While there

G-band Reflectivity Results of Conical Blackbody for Radiometer Calibration

January 14, 2018
Author(s)
Derek A. Houtz, Dazhen Gu
Two hollow conical cavities have been developed and built for the National Institute of Standards and Technology (NIST) for use as radiometric brightness temperature sources, or blackbodies. According to Kirchoff's reciprocity relation, a good absorber is

On the Susceptibility of Coded OFDM to Interference: A Simulation Study

January 3, 2018
Author(s)
Jason Coder, Yao Ma
The susceptibility of broadband wireless communications signals (e.g., LTE, IEEE 802.11) to interference has been a topic of significant research. In this paper, we implement a simulation-based study on the impact interference can have on the bit error

The Multi-Robot Large Antenna Positioning System for Over-The-Air Testing at the National Institute of Standards and Technology1

December 31, 2017
Author(s)
David R. Novotny, Josh Gordon, Michael S. Allman, Jeffrey R. Guerrieri, Alexandra Curtin, Kim Hassett, George McAdams, Quang Ton
To address dynamic testing requirements of new communications systems and RF processes that use non-static beam forming, NIST proposed the Large Antenna Positioning System (LAPS). The LAPS consists of two kinematically-linked six axis robotic arms, one of

Hybrid Characterization of Nanolitre Dielectric Fluids in a Single Microfluidic Channel up to 110 GHz Song

December 1, 2017
Author(s)
Nathan D. Orloff, Song Liu, James C. Booth, Dylan F. Williams, Dominec Schreurs, Bart Nauwelaers, Iija Oclet, Charles A. Little
In this work, we present a new “hybrid” method for dielectric measurements of nanolitre fluid samples on-wafer. The first part of the hybrid method is a technique which extracts the 4 complex permittivity of the microfluidic channel wall material. The

Characterization of Transmission Lines with Nonlinear Dielectric Materials

November 28, 2017
Author(s)
Aaron M. Hagerstrom, Christian J. Long, Nathan D. Orloff, James C. Booth, Eric J. Marksz
Nonlinear transmission lines are interesting for two broad reasons: first, they have several direct device applications (i.e. harmonic generation, and phase shifters), and second, they provide a way to characterize nonlinear materials at mm-wave

Establishing Traceability for SOLT Calibration Kits*

November 28, 2017
Author(s)
Ronald A. Ginley
Establishing traceability for a measurement is very important so that the results of the measurement can be used in a common framework for comparisons and understanding. The standard source of traceability for Short-Open-Load-Thru (SOLT) calibrations has

Rydberg Atom Electric-Field Metrology

November 28, 2017
Author(s)
Joshua A. Gordon, Christopher L. Holloway, Matthew T. Simons
We present a technique which shows great promise for realizing an atomic standard measurement of RF fields that is intrinsically calibrated, directly linked to the SI and atomic structural constants. This technique relies on the reponse of Rydberg atoms to

Kicking the Tires of the NIST Microwave Uncertainty Framework Part 2*

November 27, 2017
Author(s)
Ronald A. Ginley
Traceability of a measurement requires two parts. An unbroken chain of measurements and uncertainties for each link of the chain. The NIST Microwave Uncertainty Framework (MUF) can provide both the required parts for a single link in the chain or for

Development of A New Atom-Based SI Traceable Electric-Field Metrology Technique

October 18, 2017
Author(s)
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon
We are developing a fundamentally new atom-based approach for Electric (E) metrology. This technique has the capability of becoming a new international standard for E-field measurements and calibrations. Since this new approach is based on atomic

Submillimeter Wavelength Scattering from Random Rough Surfaces

August 9, 2017
Author(s)
Erich N. Grossman, Richard A. Chamberlin, David R. Novotny, Joshua A. Gordon, Nina P. Basta
We describe bistatic scattering measurements on eight reference targets constructed from Al 2O 3 grit of various sizes embedded in an absorptive epoxy matrix. These samples' surface topographies were measured using focus-variation microscopy, and their

Efficient Rectangular Waveguide to Stripline Transition in D Band

August 7, 2017
Author(s)
Dazhen Gu, Xifeng Lu, Ronald A. Ginley
We present a waveguide-to-stripline transition for a full {\it D}-band operation from 110 GHz to 170 GHz. An E-plane probe in parallel with waveguide main axis is configured to effectively couple the signal in the primary $\text{TE}_{10}$ mode from the

3.5 GHz Radar Waveform Capture at Fort Story

August 4, 2017
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Peter J. Jeavons, Michael R. Souryal, Adam J. Wunderlich, Mark Lofquist
We describe measurements to create a library of high-fidelity waveforms of federal incumbent radar signals currently operating in the 3550 MHz – 3650 MHz (“3.5 GHz”) band. In this second phase of assembling the library, measurements were collected at Fort

Atom-based RF electric field metrology above 100 GHz

July 16, 2017
Author(s)
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon
While atom-based radio-frequency (RF) electric field probes have the potential to improve electric field measurements for a broad range of frequencies (from a few GHz to 100s of GHz) and field strengths (mV/m to kV/m), extending the measurement

Equivalent Isotropic Response as a Surrogate for Incident Field Strength

July 9, 2017
Author(s)
Dan Kuester, Duncan McGillivray, William F. Young, John M. Ladbury, Ari Feldman, Adam Wunderlich, Sheryl M. Genco
The strength of a radiated field at some location in free space can be described in terms of the equivalent conducted output from an isotropic probe antenna with a specified reference polarization. This metric has already entered use by various standards

A Review of the IEEE 1785 Standards for Rectangular Waveguides above 110 GHz

June 6, 2017
Author(s)
Ronald A. Ginley, Nick M. Ridler
A new series of standards has recently been published by IEEE defining waveguide for use at millimeter-wave and terahertz frequencies. The series comprises three standards covering different aspects of this technology: (i) frequency bands and waveguide

Comprehensive circuit model of auto-limiting superconductor devices and systems

May 31, 2017
Author(s)
Jordi Mateu, C Collado, A Hueltes, D Garcia-Pastor, R Perera, Nikhil M. Joshi, Xifeng Lu, Nate Orloff, Jim Booth
This paper presents a phenomenological equivalent circuit to model the phenomenon occurring when a section of superconducting transmission line transits from the superconductor to the normal state. This phenomenon allows the use of superconductors for the
Displaying 101 - 125 of 1560