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Development of A New Atom-Based SI Traceable Electric-Field Metrology Technique



Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon


We are developing a fundamentally new atom-based approach for Electric (E) metrology. This technique has the capability of becoming a new international standard for E-field measurements and calibrations. Since this new approach is based on atomic transitions of alkali atoms (mainly caesium and rubidium atoms), the probe is self-calibrating and has a capability of performing measurement over a large bandwidth (from 10's MHz to into the THz range). This new approach will lead to a self-calibrated, SI traceable E-field measurement and has the capability to perform measurements on a fine spatial resolution in both the far-field and near-field. We will report on the development of this new metrology approach, including the first fiber- coupled vapor-cell for E-field measurements. We discuss key applications, including self- calibrated measurements, millimeter-wave and sub-THz measurements, field mapping, and sub- wavelength and near-field imaging. We show results for space-free measurements of E-field, for measuring the E-field distribution along the surface of a circuit board, and for measuring the directivity pattern of a horn antenna.
Conference Dates
October 15-20, 2017
Conference Location
Atlanta, GA
Conference Title
Antenna Measurements Techniques Association: 39th Annual Symposium


atom-based metrology, e-feilds measurements, rydberg atoms


Holloway, C. , Simons, M. and Gordon, J. (2017), Development of A New Atom-Based SI Traceable Electric-Field Metrology Technique, Antenna Measurements Techniques Association: 39th Annual Symposium, Atlanta, GA, [online], (Accessed June 13, 2024)


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Created October 18, 2017, Updated November 14, 2017