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Submillimeter Wavelength Scattering from Random Rough Surfaces

Published

Author(s)

Erich N. Grossman, Richard A. Chamberlin, David R. Novotny, Joshua A. Gordon, Nina P. Basta

Abstract

We describe bistatic scattering measurements on eight reference targets constructed from Al2O3 grit of various sizes embedded in an absorptive epoxy matrix. These samples' surface topographies were measured using focus-variation microscopy, and their autocorrelation lengths and root-mean-square (RMS) roughness levels extracted. Bistatic scattering measurements were then performed in the principal plane over the 325-500 GHz range and at 650 GHz, using either a vector network analyzer or a narrow band source and detector respectively, in both s an p polarizations, and at incidence angles of 25o, 45o, and 65o. The samples' root-mean-square (RMS)roughness levels cover the range of 36-280 υm, corresponding to 0.39
Citation
IEEE Transactions on Terahertz Science and Technology
Volume
7
Issue
5

Keywords

terahertz, millimeter-wave, submillimeter, scattering, bistatic

Citation

Grossman, E. , Chamberlin, R. , Novotny, D. , Gordon, J. and Basta, N. (2017), Submillimeter Wavelength Scattering from Random Rough Surfaces, IEEE Transactions on Terahertz Science and Technology, [online], https://doi.org/10.1109/TTHZ.2017.2725481 (Accessed June 24, 2024)

Issues

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Created August 9, 2017, Updated November 10, 2018