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Atom-based RF electric field metrology above 100 GHz



Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon


While atom-based radio-frequency (RF) electric field probes have the potential to improve electric field measurements for a broad range of frequencies (from a few GHz to 100s of GHz) and field strengths (mV/m to kV/m), extending the measurement capabilities to the high frequency ($>$100 GHz) and low field strength regimes have been problematic. We present SI-traceable electric field measurements of RF fields above 100 GHz, using Autler-Townes splitting of Rydberg EIT in a rubidium (Rb) vapor. We also demonstrate several techniques, including RF detuning from resonance and enhanced absorption, for increasing the probe sensitivity.
Conference Dates
February 13-18, 2016
Conference Location
San Francisco, CA
Conference Title
SPIE: Photomics WEST


electromagnetically-induced transparency, mm-wave, SI traceability, electric field metrology, atom-based metrology


Holloway, C. , Simons, M. and Gordon, J. (2017), Atom-based RF electric field metrology above 100 GHz, SPIE: Photomics WEST, San Francisco, CA (Accessed April 18, 2024)
Created July 16, 2017, Updated March 12, 2018