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Displaying 1676 - 1700 of 5220

Comb-calibrated laser ranging for three-dimensional surface profiling with micrometer-level precision at a distance

October 6, 2014
Author(s)
Esther Baumann, Fabrizio R. Giorgetta, Jean-Daniel Deschenes, William C. Swann, Ian R. Coddington, Nathan R. Newbury
Non-contact surface mapping at a distance is interesting in diverse applications including industrial metrology, manufacturing, forensics, and artifact documentation and preservation. Frequency modulated continuous wave (FMCW) laser detection and ranging

Estimation of uncertainty in application profiles

October 3, 2014
Author(s)
David W. Flater
Performance is an important facet of software quality, and application profiling tools are the instruments used to measure software performance at the function and application levels. The most powerful measurement method available in application profiling

Amplifier and Transistor Noise-Parameter Measurements

October 1, 2014
Author(s)
James P. Randa
Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions, noise parameters are defined and the most common measurement strategies are presented, both for

An improved L1 based algorithm for standardized planar datum establishment

October 1, 2014
Author(s)
Craig M. Shakarji, Vijay Srinivasan
This paper has two major goals. First, we present an algorithm for establishing planar datums suitable for a default in tolerancing standards. The algorithm is based on a constrained minimization search based on the L_1 (L1) norm after forming a convex

NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0

October 1, 2014
Author(s)
Chris Greer, David A. Wollman, Dean Prochaska, Paul A. Boynton, Jeffrey A. Mazer, Cuong Nguyen, Gerald FitzPatrick, Thomas L. Nelson, Galen H. Koepke, Allen R. Hefner Jr., Victoria Yan Pillitteri, Tanya L. Brewer, Nada T. Golmie, David H. Su, Allan C. Eustis, David Holmberg, Steven T. Bushby
Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110-140) directs NIST ‘‘to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperability of

Roadmap for Building Commissioning Research Workshop Summary Report

September 30, 2014
Author(s)
Natascha S. Milesi-Ferretti, David Shipley, Walter Zalis, Steven T. Bushby
This report summarizes the results of the Building Commissioning Research and Measurement Science Needs Webinar Workshop held on April 29, 2014, sponsored by the National Institute of Standards and Technology. This effort supports ongoing research into

Degrees of Equivalence for Chemical Measurement Capabilities: Primary pH

September 10, 2014
Author(s)
David L. Duewer, Kenneth W. Pratt, Chainarong Cherdchu, Nongluck Tangpaisarnkul2 Nongluck Tangpaisarnkul2, Akiharu Hioki, Masaki Ohata, Petra Spitzer, Michal M?ri?ssy, Leo? Vysko?il
The Key Comparison (KC) studies of the Consultative Committee for Amount of Substance – Metrology in Chemistry (CCQM) help ensure the reliability of chemical and biochemical measurements relevant to international trade and environmental , health , and
Displaying 1676 - 1700 of 5220
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