Postek, M.
, Vladar, A.
and Ming, B.
(2009),
On the Sub-Nanometer Resolution of Scanning Electron and Scanning Helium Ion Microscopes, Microscopy Today, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901569
(Accessed January 18, 2025)
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On the Sub-Nanometer Resolution of Scanning Electron and Scanning Helium Ion Microscopes
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Created March 1, 2009, Updated February 19, 2017