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Displaying 1601 - 1625 of 4224

A Methodology for Handling Standards Terminology for Sustainable Manufacturing

October 30, 2013
Author(s)
Anantha Narayanan Narayanan, David J. Lechevalier, Katherine C. Morris, Sudarsan Rachuri
In order to develop the discipline of sustainable manufacturing, the language of discourse needs to be properly and clearly communicated, for both manufacturers and consumers. As a result a range of information standards that define the needed terminology

Three-dimensional deep sub-wavelength defect detection using (lambda) = 193 nm optical microscopy

October 25, 2013
Author(s)
Bryan M. Barnes, Martin Y. Sohn, Francois R. Goasmat, Hui Zhou, Andras Vladar, Richard M. Silver, Abraham Arceo
Identifying defects in photolithographic patterning is a persistent challenge in semiconductor manufacturing. Well-established optical methods in current use are jeopardized by upcoming sub-20 nm device dimensions. Volumetric processing of focus-resolved

Towards Mobile Manipulator Safety Standards

October 24, 2013
Author(s)
Jeremy A. Marvel, Roger V. Bostelman
We present an overview of the current safety standards for industrial robots and automated guided vehicles (AGVs), and describe how they relate to the safety concerns of mobile manipulators (robot arms mounted on mobile bases) in modern manufacturing

A Literature Review of Sensor Ontologies for Manufacturing Applications

October 23, 2013
Author(s)
Craig I. Schlenoff, Tsai Hong Hong, Roger D. Eastman
The purpose of this paper is to review existing sensor and sensor network ontologies to understand whether they can be reused as a basis for a manufacturing perception sensor ontology, or if the existing ontologies hold lessons for the development of a new

Economics of the U.S. Additive Manufacturing Industry

August 14, 2013
Author(s)
Douglas Thomas
There is a general concern that the US manufacturing industry has lost competitiveness with other nations. Additive manufacturing may provide an important opportunity for advancing US manufacturing while maintaining and advancing US innovation. Additive

NIST Ontological Visualization Interface for Standards: User’s Guide

August 1, 2013
Author(s)
David J. Lechevalier, Anantha Narayanan Narayanan, Katherine C. Morris, Sean Reidy, Sudarsan Rachuri
The NIST Ontological Visualization Interface for Standards (NOVIS) was developed at the National Institute of Standards and Technology (NIST) to provide an interactive visual interface to the terminology used in a variety of standards related to
Displaying 1601 - 1625 of 4224
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