Uncertainty Due to Finite Resolution Measurements

Published

January 1, 2004

Author(s)

Steven D. Phillips, B Tolman, William T. Estler

Abstract

We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results that strongly depends on the relative location of the true value to the resolution increment. We show that although there is no simple expression relating the standard deviation of the distribution to the uncertainty at a specified level of confidence, there is an analytic relation between the mean value and the standard deviation. We further investigate the conflict between the GUM and ISO 14253-2 regarding the method of evaluating the standard uncertainty due to finite resolution and show that, on average, the GUM method is superior, but still approximate.

Proceedings Title

Proceedings of ASPE Spring Topical Meeting on Uncertainty Analysis in Measurement and Design

Conference Dates

June 30-July 1, 2004

Conference Location

State College, PA

Conference Title

ASPE Spring Topical Meeting on Uncertainty Analysis in Measurement and Design

Pub Type

Conferences

Keywords

A/D, analog to digital conversion, error, resolution, uncertainty

Citation

Phillips, S. , Tolman, B. and Estler, W. (2004), Uncertainty Due to Finite Resolution Measurements, Proceedings of ASPE Spring Topical Meeting on Uncertainty Analysis in Measurement and Design, State College, PA (Accessed October 18, 2025)