Newell, D.
, Whitenton, E.
, Kramar, J.
, Pratt, J.
and Smith, D.
(2004),
Progress Towards SI Traceable Force Metrology for Nanomechanics, Journal of Materials Research
(Accessed December 15, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Progress Towards SI Traceable Force Metrology for Nanomechanics
Published
Author(s)
, , , ,
Abstract
This paper is based, in its entirety, on NIST-approved publications: Calibration of Piezoresistive Cantilever Force Sensors Using the NIST Electrostatic Force Balance, The NIST Electrostatic Force Balance Experiment, The NIST Microforce Realization and Measurement Project, and Microforce and Instrumented Indentation Research at the National Institute of Standards and Technology, Gaithersburg, MD.Citation
Journal of Materials Research
Volume
19(1)
Pub Type
Journals
Keywords
calibration, force metrology, instrumented indentation research, microforce, nanomechanics
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 2003, Updated October 12, 2021