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Progress Towards SI Traceable Force Metrology for Nanomechanics



David B. Newell, Eric P. Whitenton, John A. Kramar, Jon R. Pratt, Douglas T. Smith


This paper is based, in its entirety, on NIST-approved publications: Calibration of Piezoresistive Cantilever Force Sensors Using the NIST Electrostatic Force Balance, The NIST Electrostatic Force Balance Experiment, The NIST Microforce Realization and Measurement Project, and Microforce and Instrumented Indentation Research at the National Institute of Standards and Technology, Gaithersburg, MD.
Journal of Materials Research


calibration, force metrology, instrumented indentation research, microforce, nanomechanics


Newell, D. , Whitenton, E. , Kramar, J. , Pratt, J. and Smith, D. (2004), Progress Towards SI Traceable Force Metrology for Nanomechanics, Journal of Materials Research (Accessed June 18, 2024)


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Created December 31, 2003, Updated October 12, 2021