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PUBLICATIONS

Progress Towards SI Traceable Force Metrology for Nanomechanics

Published

Author(s)

David B. Newell, Eric P. Whitenton, John A. Kramar, Jon R. Pratt, Douglas T. Smith

Abstract

This paper is based, in its entirety, on NIST-approved publications: Calibration of Piezoresistive Cantilever Force Sensors Using the NIST Electrostatic Force Balance, The NIST Electrostatic Force Balance Experiment, The NIST Microforce Realization and Measurement Project, and Microforce and Instrumented Indentation Research at the National Institute of Standards and Technology, Gaithersburg, MD.
Citation
Journal of Materials Research
Volume
19(1)
Pub Type
Journals

Keywords

calibration, force metrology, instrumented indentation research, microforce, nanomechanics
Manufacturing

Citation

Newell, D. , Whitenton, E. , Kramar, J. , Pratt, J. and Smith, D. (2004), Progress Towards SI Traceable Force Metrology for Nanomechanics, Journal of Materials Research (Accessed October 24, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 2003, Updated October 12, 2021
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